JAN1N4623 データシートの表示（PDF） - Microsemi Corporation
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JAN1N4623 Datasheet PDF : 3 Pages
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SCOTTSDALE DIVISION
1N4099 thru 1N4135-1 and
1N4614 thru 1N4627-1 DO-35
500 mW GLASS AXIAL-LEAD LOW NOISE
ZENER DIODES
CIRCUIT AND GRAPHS
Noise density, (ND) is specified in microvolt-rms per squre-
root-hertz. Actual measurement is performed using a 1 KHz
to 3 KHz frequency bandpass filter at a constant Zener test
current (IZT) AT 25oC ambient temperature. ND is calculated
from the formula.
FIGURE 1
NOISE DENSITY MEASUREMENT CIRCUIT
TL – Lead Temperature (oC) 3/8” from body
or TA on FR4 PC Board
FIGURE 2 – POWER DERATING CURVE
PACKAGE DIMENSIONS
FIGURE 3
CAPACITANCE vs. ZENER VOLTAGE
(TYPICAL)
All dimensions in: INCH
mm
Copyright 2003
11-05-2003 REV C
Microsemi
Scottsdale Division
8700 E. Thomas Rd. PO Box 1390, Scottsdale, AZ 85252 USA, (480) 941-6300, Fax: (480) 947-1503
Page 3
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