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K8A1215ETC データシートの表示(PDF) - Samsung

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K8A1215ETC
Samsung
Samsung Samsung
K8A1215ETC Datasheet PDF : 84 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
K8A12(13)15ET(B/Z)C
Rev. 1.1
datasheet NOR FLASH MEMORY
512M Bit (32M x16) Synch Burst, Multi Bank SLC NOR Flash Memory
1.0 FEATURES
2.0 GENERAL DESCRIPTION
Single Voltage, 1.7V to 1.95V for Read and Write operations
Organization
- 33,554,432 x 16 bit (Word Mode Only)
Read While Program/Erase Operation
Multiple Bank Architecture
- 16 Banks (32Mb Partition)
OTP Block : Extra 512-Word block
Read Access Time (@ CL=30pF)
- Asynchronous Random Access Time : 100ns
- Synchronous Random Access Time :95ns
- Burst Access Time :
11ns(66Mhz) / 9ns(83Mhz) / 7ns (108MHz) / 6ns (133MHz)
Page Mode Operation
16Words Page access allows fast asynchronous read
Page Read Access Time :
18ns(66/83Mhz) / 15ns(108/133Mhz)
Burst Length :
- Continuous Linear Burst
- Linear Burst : 8-word & 16-word with Wrap
Block Architecture
- Uniform block part (K8A(10/11/12/13)15EZC) :
Five hundred twelve 64Kword blocks
- Boot block part (K8A(10/11/12/13)15ET(B)C) :
Four 16Kword blocks and five hundred eleven 64Kword blocks (Bank 0
contains four 16 Kword blocks and thirty-one 64Kword blocks, Bank 1 ~
Bank 15 contain four hundred eighty 64Kword blocks)
Reduce program time using the VPP
Support 512-word Buffer Program
Power Consumption (Typical value, CL=30pF)
- Synchronous Read Current : 35mA
- Program/Erase Current : 25mA
- Read While Program/Erase Current : 45mA
- Standby Mode/Auto Sleep Mode : 30uA
Block Protection/Unprotection
- Using the software command sequence
- Last two boot blocks are protected by WP=VIL
(Boot block part : K8A(10/11/12/13)15ET(B)C)
- Last one block (BA511) is protected by WP=VIL
(Uniform block part : K8A(10/11/12/13)15EZC)
- All blocks are protected by VPP=VIL
Handshaking Feature
- Provides host system with minimum latency by monitoring RDY
Erase Suspend/Resume
Program Suspend/Resume
Unlock Bypass Program/Erase
Hardware Reset (RESET)
Deep Power Down Mode
Data Polling and Toggle Bits
- Provides a software method of detecting the status of program
or erase completion
Endurance
- 100K Program/Erase Cycles Minimum
Extended Temperature : -25°C ~ 85°C
Support Common Flash Memory Interface
Output Driver Control by Configuration Register
Low Vcc Write Inhibit
Package : TBD
The K8A(10/11/12/13)15E featuring single 1.8V power supply is a 512Mbit
Muxed Burst Multi Bank Flash Memory organized as 32Mx16. The memory
architecture of the device is designed to divide its memory arrays into
512blocks(Uniform block part)/515blocks(Boot block part) with indepen-
dent hardware protection. This block architecture provides highly flexible
erase and program capability. The K8A(10/11/12/13)15E NOR Flash con-
sists of sixteen banks. This device is capable of reading data from one
bank while programming or erasing in the other bank. Regarding read
access time, the K8A10/1215E provides an 11ns burst access time and an
95ns initial access time at 66MHz. At 83MHz, the K8A10/1215E provides
an 9ns burst access time and an 95ns initial access time. At 108MHz, the
K8A11/1315E provides an 7ns burst access time and an 95ns initial access
time. At 133MHz, the K8A11/1315E provides an 6ns burst access time and
an 95ns initial access time. The device performs a program operation in
units of 16 bits (Word) and erases in units of a block. Single or multiple
blocks can be erased. The block erase operation is completed within typi-
cally 0.6sec. The device requires 25mA as program/erase current in the
extended temperature ranges.
The K8A(10/11/12/13)15E NOR Flash Memory is created by using Sam-
sung's advanced CMOS process technology.
3.0 PIN DESCRIPTION
Pin Name
A0 - A24
DQ0 - DQ15
CE
OE
RESET
VPP
WE
WP
CLK
RDY
AVD
DPD
Vcc
VSS
Pin Function
Address Inputs
Data input/output
Chip Enable
Output Enable
Hardware Reset Pin
Accelerates Programming
Write Enable
Hardware Write Protection Input
Clock
Ready Output
Address Valid Input
Deep Power Down
Power Supply
Ground
-4-

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