NCV2574DW-ADJR2 データシートの表示（PDF） - ON Semiconductor

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NCV2574DW-ADJR2

0.5 A, Adjustable Output Voltage, Step-Down Switching Regulator

ON Semiconductor 

Unregulated

DC Input

Cin

LM2574, NCV2574

Typical Application (Fixed Output Voltage Versions)

7.0 - 40 V

Unregulated

DC Input

Cin

22 mF

Feedback

(3)

+Vin

LM2574

1

L1

330 mH

5

Output

(12)

(14) 7

D1

2 Sig 4 Pwr 3 ON/OFF 1N5819

Gnd

Gnd

(4)

(6)

(5)

Cout

220 mF

5.0 V Regulated

Output 0.5 A Load

Representative Block Diagram and Typical Application

+Vin

5 (12)

3.1 V Internal

Regulator

ON/OFF

1

Feedback

(3)

R2

Fixed Gain

Error Amplifier Comparator

Sig Gnd

2

(4)

R1

1.0 k Freq

Shift

18 kHz

1.235 V

Band-Gap

Reference

52 kHz

Oscillator

Current

Limit

Latch

Reset

Driver

1.0 Amp

Switch

Thermal

Shutdown

ON/OFF

3

(5)

Output

R2

Voltage Versions

(W)

3.3 V

1.7 k

5.0 V

3.1 k

12 V

8.84 k

15 V

11.3 k

For adjustable version

R1 = open, R2 = 0 W

Output

7 (14)

Pwr Gnd

4

(6)

L1

Vout

D1

Cout

Load

NOTE: Pin numbers in ( ) are for the SO−16W package.

Figure 1. Block Diagram and Typical Application

ABSOLUTE MAXIMUM RATINGS (Absolute Maximum Ratings indicate limits beyond which damage to the device may occur).

Rating

Symbol

Value

Unit

Maximum Supply Voltage

ON/OFF Pin Input Voltage

Output Voltage to Ground (Steady State)

Vin

45

V

−

−0.3 V ≤ V ≤ +Vin

V

−

−1.0

V

DW Suffix, Plastic Package Case 751G

Max Power Dissipation

Thermal Resistance, Junction−to−Air

N Suffix, Plastic Package Case 626

Max Power Dissipation

Thermal Resistance, Junction−to−Ambient

Thermal Resistance, Junction−to−Case

Storage Temperature Range

Minimum ESD Rating

(Human Body Model: C = 100 pF, R = 1.5 kW)

Lead Temperature (Soldering, 10 seconds)

PD

RqJA

PD

RqJA

RqJC

Tstg

−

−

Internally Limited

145

Internally Limited

100

5.0

−65°C to +150°C

2.0

260

W

°C/W

W

°C/W

°C/W

°C

kV

°C

Maximum Junction Temperature

TJ

150

°C

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

NOTE: ESD data available upon request.

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