LTC1151CN8(Rev0) データシートの表示（PDF） - Linear Technology
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LTC1151CN8 Datasheet PDF : 8 Pages
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LTC1151
ELECTRICAL CHARACTERISTICS
VS = ±15V, TA = Operating Temperature Range, unless otherwise specified.
PARAMETER
Maximum Output Voltage Swing
Slew Rate
Gain-Bandwidth Product
Supply Current per Amplifier
Internal Sampling Frequency
CONDITIONS
RL = 10k, TA = 25°C
RL = 10k
RL = 100k
RL = 10k, CL = 50pF
No Load, TA = 25°C
No Load
LTC1151C
MIN TYP MAX
±13.5 ±14.50
q +10.5/–13.5
±14.95
2.5
2
0.9
1.5
q
2.0
1000
UNITS
V
V
V
V/µs
MHz
mA
mA
Hz
VS = 5V, TA = Operating Temperature Range, unless otherwise specified.
Input Offset Voltage
Average Input Offset Drift
TA = 25°C (Note 3)
(Note 3)
Long Term Offset Voltage Drift
Input Offset Current
Input Bias Current
Input Noise Voltage
Input Noise Current
TA = 25°C
TA = 25°C
RS = 100Ω, 0.1Hz to 10Hz
RS = 100Ω, 0.1Hz to 1Hz
f = 10Hz (Note 4)
Input Voltage Range
Positive
Negative
Common-Mode Rejection Ratio
Power Supply Rejection Ratio
Large-Signal Voltage Gain
Maximum Output Voltage Swing
Slew Rate
Gain Bandwidth Product
VCM = 0V to 2.7V
VS = ±2.375V to ±16V
RL = 10k, VOUT = 0.3V to 4.5V
RL = 10k to GND
RL = 100k to GND
RL = 10k, CL = 50pF
Supply Current per Amplifier
No Load, TA = 25°C
Internal Sampling Frequency
±0.05 ±5
µV
q
±0.01 ±0.05
µV/°C
50
nV/√mo
±10
100
pA
±5
50
pA
2.0
µVP-P
0.7
µVP-P
1.3
fA/√Hz
2.7
3.2
V
0
– 0.3
V
110
dB
q
110 130
dB
q
115 140
dB
4.85
V
4.97
V
1.5
V/µs
1.5
MHz
0.5
1.0
mA
q
1.5
mA
750
Hz
• The denotes the specifications which apply over the full operating
temperature range.
Note 1: Absolute Maximum Ratings are those values beyond which life of
the device may be impaired.
Note 2: Connecting any terminal to voltages greater than V+ or less than
V– may cause destructive latch-up. It is recommended that no sources
operating from external supplies be applied prior to power-up of the
LTC1151.
Note 3: These parameters are guaranteed by design. Thermocouple
effects preclude measurement of these voltage levels in high speed
automatic test systems. VOS is measured to a limit determined by test
equipment capability.
Note 4: Current Noise is calculated from the formula:
IN = √(2q • Ib)
where q = 1.6 × 10–19 Coulomb.
3
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