AM27X512 データシートの表示（PDF） - Advanced Micro Devices

部品番号

コンポーネント説明

メーカー

AM27X512

512 Kilobit (64 K x 8-Bit) CMOS ExpressROM Device

Advanced Micro Devices 

TEST CONDITIONS

5.0 V

Device

Under

Test

CL

6.2 kΩ

2.7 kΩ

Note:

Diodes are IN3064 or equivalents.

Figure 3. Test Setup

12081F-7

SWITCHING TEST WAVEFORM

2.4 V

0.45 V

2.0 V

2.0 V

Test Points

0.8 V

0.8 V

Input

Output

Table 1. Test Specifications

Test Condition

All

Unit

Output Load

1 TTL gate

Output Load Capacitance, CL

(including jig capacitance)

100

pF

Input Rise and Fall Times

≤ 20

ns

Input Pulse Levels

0.45–2.4

V

Input timing measurement reference

levels

0.8, 2.0

V

Output timing measurement

reference levels

0.8, 2.0

V

Note: For CL = 100 pF.

12081F-8

KEY TO SWITCHING WAVEFORMS

WAVEFORM

INPUTS

Steady

OUTPUTS

Changing from H to L

Changing from L to H

Don’t Care, Any Change Permitted

Changing, State Unknown

Does Not Apply

Center Line is High Impedance State (High Z)

KS000010-PAL

Am27X512

7

Share Link: