M28C16B, M28C17B
Table 9A. Read Mode AC Characteristics for M28CxxB (5V range)
(TA = 0 to 70 °C or -40 to 85 °C; VCC = 4.5 to 5.5 V)
Symbol Alt.
Parameter
Test
Condition
M28CxxB
-90
-12
Min Max Min Max
tAVQV
tACC Address Valid to Output Valid
E = VIL,
G = VIL
90
120
tELQV
tCE Chip Enable Low to Output Valid
G = VIL
90
120
tGLQV
tOE Output Enable Low to Output Valid
E = VIL
40
45
tEHQZ1
tDF Chip Enable High to Output Hi-Z
G = VIL
0
40
0
45
tGHQZ1
tDF Output Enable High to Output Hi-Z
E = VIL
0
40
0
45
tAXQX
tOH Address Transition to Output Transition
E = VIL,
G = VIL
0
0
Note: 1. Output Hi-Z is defined as the point at which data is no longer driven.
Unit
ns
ns
ns
ns
ns
ns
Table 9B. Read Mode AC Characteristics for M28CxxB-W (3V range)
(TA = 0 to 70 °C or -40 to 85 °C; VCC = 2.7 to 3.6 V)
Symbol Alt.
Parameter
Test
Condition
M28CxxB-W
-12
-15
Min Max Min Max
tAVQV
tACC Address Valid to Output Valid
E = VIL,
G = VIL
120
150
tELQV
tCE Chip Enable Low to Output Valid
G = VIL
120
150
tGLQV
tOE Output Enable Low to Output Valid
E = VIL
80
80
tEHQZ1
tDF Chip Enable High to Output Hi-Z
G = VIL
0
45
0
50
tGHQZ1
tDF Output Enable High to Output Hi-Z
E = VIL
0
45
0
50
tAXQX
tOH Address Transition to Output Transition
E = VIL,
G = VIL
0
0
Note: 1. Output Hi-Z is defined as the point at which data is no longer driven.
Unit
ns
ns
ns
ns
ns
ns
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