29W040 データシートの表示（PDF） - STMicroelectronics
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29W040 Datasheet PDF : 31 Pages
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Table 9. AC Measurement Conditions
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
≤ 10ns
0 to 3V
1.5V
Figure 4. AC Testing Input Output Waveform
3V
1.5V
0V
AI01417
M29W040
Figure 5. AC Testing Load Circuit
0.8V
1N914
DEVICE
UNDER
TEST
3.3kΩ
OUT
CL = 30pF or 100pF
CL includes JIG capacitance
AI01968
Table 10. Capacitance (1) (TA = 25 °C, f = 1 MHz )
Symbol
Parameter
Test Condition
CIN
Input Capacitance
VIN = 0V
COUT
Output Capacitance
Note: 1. Sampled only, not 100% tested.
VOUT = 0V
Min
Max
Unit
6
pF
12
pF
Table 11. DC Characteristics
(TA = 0 to 70°C, –20 to 85°C or –40 to 85°C; VCC = 2.7V to 3.6V)
Symbol
Parameter
Test Condition
ILI
Input Leakage Current
0V ≤ VIN ≤ VCC
ILO
Output Leakage Current
0V ≤ VOUT ≤ VCC
ICC1 Supply Current (Read)
E = VIL, G = VIH, f = 6MHz
ICC2 Supply Current (Standby) TTL
E = VIH
ICC3 Supply Current (Standby) CMOS
E = VCC ± 0.2V
ICC4 Supply Current (Program or Erase)
Byte Program,
Block Erase
ICC5 Supply Current
ICC6 Power Down Current
VIL
Input Low Voltage
VIH Input High Voltage
VOL Output Low Voltage
VOH Output High Voltage CMOS
VID
IID
VLKO
A9 Voltage (Electronic Signature)
A9 Current (Electronic Signature)
Supply Voltage (Erase and
Program lock-out)
Chip Erase in progress
E = VCC ± 0.2V
IOL = 2mA
IOH = –100µA
IOH = –2.0mA
A9 = VID
Min
–0.5
0.7 VCC
VCC –0.4
0.85 VCC
11.5
1.9
Max
±1
±1
20
0.2
50
20
40
5
0.8
VCC + 0.5
0.45
12.5
50
2.2
Unit
µA
µA
mA
mA
µA
mA
mA
µA
V
V
V
V
V
V
µA
V
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