AS29F010 データシートの表示（PDF） - Alliance Semiconductor
部品番号
コンポーネント説明
メーカー
AS29F010 Datasheet PDF : 10 Pages
| |||
$65<)343
®
&RPPDQG#FRGH#WDEOH
Mode
Reset
DIN[3]
Write[3] data
00h
AIN[4]
Write[4]
address
x
Status
01h
x
ID Read
code
02h
0000h
0001h
Verify-0 04h
AIN
Verify-1 08h
AIN
Converge 10h
AIN
Program 40h
AIN
Erase
80h
AIN
DIN[4]
data Read address
x
0000h
x
0000h
x
0000h
x
0001h
x
AIN
x
AIN
00h AIN
DIN
AIN
FFh AIN
Read data
Status
Status
Mfr. code
Device code
DOUT
DOUT
Status
Status
Status
Read delay
100 ns
100 ns
52h 100 ns
04h 100 ns
25 µs
25 µs
100 ns
100 ns
100 ns
Maximum time out
250 µs
250 µs
250 µs
250 µs
250 µs
250 µs
250 µs
1000 µs
&RPPDQG#DOJRULWKPV
Individual write commands are used together in eight program and erase algorithms to guarantee the AS29F010 operating margins for the
life of the part. Refer to the AS29F010 Programming Specification for details on the algorithms for program and erase operation .
5HFRPPHQGHG#RSHUDWLQJ#FRQGLWLRQV
Parameter
Supply voltage
Input voltage
Symbol
Min
VCC
4.5
VSS
0
VIH
2.0
VIL
–0.5
+7D# #3ƒ&#WR#.:3ƒ&,
Typ
Max
Unit
5.0
5.5
V
0
0
V
-
VCC + 1.0 V
-
0.8
V
$EVROXWH#PD[LPXP#UDWLQJV
Parameter
Symbol
Min
Max
Unit
Input voltage (Input or DQ pin)
VIN
–1.0
VCC + 1.0 V
Input voltage (A9 pin)
VIN
–1.0
+13.0
V
Output voltage
VOUT
–1.0
VCC + 1.0 V
Power supply voltage
VCC
+4.5
+5.5
V
Operating temperature
TOPR
–55
+125
°C
Storage temperature (plastic)
TSTG
–65
+125
°C
Short circuit output current
IOUT
-
100
mA
Latch-up current
IIN
-
±100
mA
Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions outside those indicated in the operational sections of this specification is notimplied. Exposure to absolute max-
imum rating conditions for extended periods may affect reliability.
7
$//,$1&(#6(0,&21'8&725
','#4407333:0$1#72:233
Share Link: 