MACH445-20 データシートの表示（PDF） - Lattice Semiconductor

部品番号

コンポーネント説明

メーカー

MACH445-20

High-Density EE CMOS Programmable Logic

Lattice Semiconductor 

ABSOLUTE MAXIMUM RATINGS

Storage Temperature . . . . . . . . . . . –65°C to +150°C

Ambient Temperature

with Power Applied . . . . . . . . . . . . . –55°C to +125°C

Supply Voltage with

Respect to Ground . . . . . . . . . . . . . –0.5 V to +7.0 V

DC Input Voltage . . . . . . . . . . . . –0.5 V to VCC +0.5 V

DC Output or

I/O Pin Voltage . . . . . . . . . . . . . –0.5 V to VCC +0.5 V

Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V

Latchup Current

(TA = 0°C to +70°C) . . . . . . . . . . . . . . . . . . . . 200 mA

OPERATING RANGES

Commercial (C) Devices

Temperature (TA) Operating

in Free Air . . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C

Supply Voltage (VCC) with

Respect to Ground . . . . . . . . . . . . +4.75 V to +5.25 V

Operating ranges define those limits between which the

functionality of the device is guaranteed.

Stresses above those listed under Absolute Maximum

Ratings may cause permanent device failure. Functionality at

or above these limits is not implied. Exposure to Absolute

Maximum Ratings for extended periods may affect device

reliability. Programming conditions may differ.

DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise specified

Parameter

Symbol

VOH

Parameter Description

Output HIGH Voltage

VOL

Output LOW Voltage

VIH

Input HIGH Voltage

VIL

Input LOW Voltage

IIH

Input HIGH Leakage Current

IIL

Input LOW Leakage Current

IOZH

Off-State Output Leakage

Current HIGH

IOZL

Off-State Output Leakage

Current LOW

ISC

Output Short-Circuit Current

ICC

Supply Current

Test Conditions

Min Typ Max Unit

IOH = –3.2 mA, VCC = Min

VIN = VIH or VIL

IOL = 24 mA, VCC = Min

VIN = VIH or VIL (Note 1)

2.4

V

0.5 V

Guaranteed Input Logical HIGH

2.0

V

Voltage for all Inputs (Note 2)

Guaranteed Input Logical LOW

Voltage for all Inputs (Note 2)

0.8 V

VIN = 5.25 V, VCC = Max (Note 3)

VIN = 0 V, VCC = Max (Note 3)

10 µA

–100 µA

VOUT = 5.25 V, VCC = Max

VIN = VIH or VIL (Note 3)

10 µA

VOUT = 0 V, VCC = Max

VIN = VIH or VIL (Note 3)

–100 µA

VOUT = 0.5 V, VCC = Max (Note 4)

–30

–160 mA

VIN = 0 V, Outputs Open (IOUT = 0 mA)

255

mA

VCC = 5.0 V, f =25 MHz, TA = 25°C (Note 5)

CAPACITANCE (Note 6)

Parameter

Symbol

Parameter Description

Test Conditions

Typ Unit

CIN

Input Capacitance

VIN = 2.0 V

VCC = 5.0 V, TA = 25°C,

6

pF

COUT

Output Capacitance

VOUT = 2.0 V f = 1 MHz

8

pF

Notes:

1. Total IOL for one PAL block should not exceed 128 mA.

2. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.

3. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).

4. Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second.

VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.

5. Measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and capable of being loaded,

enabled, and reset.

6. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified

where capacitance may be affected.

MACH445-12 (Com’l)

9

Share Link: