MAL211814102E3 データシートの表示（PDF） - Vishay Semiconductors
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MAL211814102E3 Datasheet PDF : 11 Pages
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118 AHT
Vishay BCcomponents
Table 5
MULTIPLIER OF RIPPLE CURRENT (IR) AS A FUNCTION OF FREQUENCY
FREQUENCY (Hz)
UR
(V)
50
100
300
1000
IR MULTIPLIER
6.3
0.95
1.00
1.07
1.12
10
0.95
1.00
1.07
1.12
16
0.95
1.00
1.07
1.12
25
0.95
1.00
1.07
1.12
40
0.90
1.00
1.12
1.20
63
0.90
1.00
1.12
1.20
100
0.85
1.00
1.20
1.30
200
0.85
1.00
1.20
1.30
3000
1.15
1.15
1.15
1.15
1.25
1.25
1.35
1.35
10 000
1.20
1.20
1.20
1.20
1.30
1.30
1.40
1.40
Table 6
TEST PROCEDURES AND REQUIREMENTS
TEST
NAME OF TEST
REFERENCE
PROCEDURE
(quick reference)
REQUIREMENTS
Endurance
Useful life
IEC 60384-4 /
EN130300
subclause 4.13
CECC 30301
subclause 1.8.1
Tamb = 125 °C; UR applied;
Case sizes:
6.5 mm x 18 mm to 10 mm x 25 mm: 2000 h;
10 mm x 30 mm to 21 mm x 38 mm: 3000 h
Tamb = 125 °C; UR and IR applied;
Case Ø D x L = 6.5 mm x 18 mm to 10 mm x 25 mm:
4000 h
Case Ø D x L = 10 mm x 30 mm to 21 mm x 38 mm:
8000 h
UR 6.3 V; C/C: +15 % / -30 %
UR > 6.3 V; C/C: ± 15 %
tan 1.3 x spec. limit
Z 2 x spec. limit
IL5 spec. limit
UR 6.3 V; C/C: +45 % / -50 %
UR > 6.3 V; C/C: ± 45 %
tan 3 x spec. limit
Z 3 x spec. limit
IL5 spec. limit
no short or open circuit
total failure percentage: 1 %
(200 V 3 %)
Shelf life
(storage at high
temperature)
IEC 60384-4 /
EN130300
subclause 4.17
Tamb = 125 °C; no voltage applied;
UR = 6.3 V to 63 V: 500 h;
UR = 100 V and 200 V: 100 h
After test: UR to be applied for 30 min,
24 h to 48 h before measurement
C/C, tan , Z:
for requirements
see “Endurance test” above
IL5 2 x spec. limit
Reverse voltage
IEC 60384-4 /
EN130300
subclause 4.15
Tamb = 125 °C:
125 h at U = -1 V
followed by 125 h at UR
C/C: ± 20 %
tan spec. limit
IL5 spec. limit
Statements about product lifetime are based on calculations and internal testing. They should only be interpreted as estimations. Also due to external factors, the
lifetime in the field application may deviate from the calculated lifetime. In general, nothing stated herein shall be construed as a guarantee of durability.
Revision: 20-Apr-17
10
Document Number: 28334
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