MC100E445FN データシートの表示（PDF） - ON Semiconductor
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MC100E445FN Datasheet PDF : 13 Pages
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MC10E445, MC100E445
Table 8. AC CHARACTERISTICS VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 13)
0°C
25°C
85°C
Symbol
Characteristic
Min Typ Max Min Typ Max Min Typ Max Unit
fMAX
Maximum Conversion Frequency
2.0
2.0
2.0
Gb/s
NRZ
tPLH
Propagation Delay to Output
tPHL
CLK to Q, Reset to Q
CLK to SOUT (Diff)
CLK to CL/4(Diff)
CLK to CL/8(Diff)
ps
1500 1800 2100 1500 1800 2100 1500 1800 2100
800 975 1150 800 975 1150 800 975 1150
1100 1325 1550 1100 1325 1550 1100 1325 1550
1100 1325 1550 1100 1325 1550 1100 1325 1550
ts
Setup Time
ps
SINA, SINB
−100 −250
−100 −250
−100 −250
SEL
0 −200
0 −200
0 −200
th
Hold Time
ps
SINA, SINB, SEL
450 300
450 300
450 300
tRR
Reset Recovery Time
500 300
500 300
500 300
ps
tPW
Minimum Pulse Width
ps
CLK, MR
400
400
400
tJITTER
VPP
Random Clock Jitter (RMS)
Input Voltage Swing
(Differential Configuration)
<1
150
<1
1000 150
<1
1000 150
ps
1000 mV
tr
Rise/Fall Times 20%−80%
ps
tf
SOUT
100 225 350 100 225 350 100 225 350
Other
200 425 650 200 425 650 200 425 650
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
13. 10 Series: VEE can vary −0.46 V / +0.06 V.
100 Series: VEE can vary −0.46 V / +0.8 V.
14. Devices are designed to meet the AC specifications shown in the above table, after thermal equilibrium has been established. The circuit
is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 lfpm is maintained.
tRR
Reset
CLK / CLK
Figure 3.
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