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MC33661D データシートの表示(PDF) - Freescale Semiconductor

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MC33661D Datasheet PDF : 21 Pages
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ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 4. Dynamic Electrical Characteristics
Characteristics noted under conditions 7.0 V VSUP 18 V, - 40°C TA 125°C, GND = 0 V unless otherwise noted. Typical
values noted reflect the approximate parameter means at TA = 25°C under nominal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
LIN OUTPUT TIMING CHARACTERISTICS FOR NORMAL MODE
Dominant Propagation Delay Time TXD to LIN (6)
Measurement Threshold (50% TXD to 58.1% VSUP)
Measurement Threshold (50% TXD to 28.4% VSUP)
Recessive Propagation Delay Time TXD to LIN (6)
Measurement Threshold (50% TXD to 42.2% VSUP)
Measurement Threshold (50% TXD to 74.4% VSUP)
µs
t DOM (MIN)
50
t DOM (MAX)
50
µs
t REC (MIN)
50
t REC (MAX)
50
Propagation Delay Time Symmetry
t DOM (MIN) to t REC (MAX)
t DOM (MAX) to t REC (MIN)
µs
dt1
- 10.44
dt2
- 10.44
8.12
8.12
LIN OUTPUT TIMING CHARACTERISTICS FOR SLOW MODE
Dominant Propagation Delay Time TXD to LIN (6)
Measurement Threshold (50% TXD to 61.6% VSUP)
Measurement Threshold (50% TXD to 25.1% VSUP)
Recessive Propagation Delay Time TXD to LIN (6)
Measurement Threshold (50% TXD to 38.9% VSUP)
Measurement Threshold (50% TXD to 77.8% VSUP)
t DOM (MIN)
t DOM (MAX)
t REC (MIN)
t REC (MAX)
µs
100
100
µs
100
100
Propagation Delay Time Symmetry
t DOM (MIN) to t REC (MAX)
t DOM (MAX) to t REC (MIN)
µs
dt1S
- 21.88
dt 2S
- 21.88
17.44
17.44
LIN OUTPUT DRIVER FAST MODE
LIN Fast Slew Rate (Programming Mode)
Fast Slew Rate
dv/dt fast
V/µs
15
LIN PIN
Overcurrent Shutdown Delay Time (7)
LIN RECEIVER CHARACTERISTICS
Receiver Dominant Propagation Delay Time (8)
LIN LOW to RXD LOW
Receiver Recessive Propagation Delay Time (8)
LIN HIGH to RXD HIGH
t OV-DELAY
10
µs
t RL
µs
3.5
6.0
t RH
µs
3.5
6.0
Receiver Propagation Delay Time Symmetry
t RL - t RH
t R-SYM
µs
- 2.0
2.0
Notes
6 7.0 V VSUP 18 V. Bus load R0 and C0: 1.0 nF/1.0 k, 6.8 nF/660 , 10 nF/500 .
7 This parameter is guaranteed by design; however, it is not production tested.
8 Measured between LIN signal threshold VLINL or VLINH and 50% of RXD signal.
Analog Integrated Circuit Device Data
Freescale Semiconductor
33661
7

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