MC74LVX139MEL データシートの表示（PDF） - ON Semiconductor
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MC74LVX139MEL Datasheet PDF : 8 Pages
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MC74LVX139
A1a 3
A0a 2
Ea 1
A1b 13
A0b 14
Eb 15
X/Y
1
0
2
1
EN
2
3
4 Y0a A1a 3
5 Y1a A0a 2
6 Y2a Ea 1
7 Y3a
12 Y0b
11 Y1b A1b 13
10 Y2b A0b 14
9 Y3b Eb 15
DMUX
0
1
G
0
3
0
1
2
3
4 Y0a
5 Y1a
6 Y2a
7 Y3a
12 Y0b
11 Y1b
10 Y2b
9 Y3b
INPUT
Figure 4. IEC Logic Diagram
Figure 5. Input Equivalent Circuit
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC
PD
Positive DC Supply Voltage
Digital Input Voltage
DC Output Voltage
Input Diode Current
Output Diode Current
DC Output Current, per Pin
DC Supply Current, VCC and GND Pins
Power Dissipation in Still Air
−0.5 to +7.0
V
−0.5 to +7.0
V
−0.5 to VCC +0.5
V
−20
mA
$20
mA
$25
mA
$75
mA
SOIC Package
200
mW
TSSOP
180
TSTG
VESD
Storage Temperature Range
ESD Withstand Voltage
−65 to +150
°C
Human Body Model (Note 1)
>2000
V
Machine Model (Note 2)
>200
Charged Device Model (Note 3)
>2000
ILATCHU Latchup Performance
P
Above VCC and Below GND at 125°C (Note 4)
$300
mA
qJA
Thermal Resistance, Junction−to−Ambient
SOIC Package
143
TSSOP
164
°C/W
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
1. Tested to EIA/JESD22−A114−A
2. Tested to EIA/JESD22−A115−A
3. Tested to JESD22−C101−A
4. Tested to EIA/JESD78
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
VCC DC Supply Voltage
VIN
VOUT
DC Input Voltage
DC Output Voltage
TA Operating Temperature Range, all Package Types
tr, tf Input Rise or Fall Time
Output in 3−State
High or Low State
VCC = 5.0 V + 0.5 V
Min
Max
Unit
2.0
3.6
V
0
5.5
V
0
VCC
V
−40
85
°C
0
100
ns/V
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