74LVX541 データシートの表示（PDF） - ON Semiconductor

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74LVX541

Octal Bus Buffer

ON Semiconductor 

DEVICE

UNDER

TEST

TEST

POINT

OUTPUT

CL*

*Includes all probe and jig capacitance

Figure 6.

MC74LVX541

TEST CIRCUITS

DEVICE

UNDER

TEST

TEST

POINT

OUTPUT

1 kW

CL*

CONNECT TO VCC WHEN

TESTING tPLZ AND tPZL.

CONNECT TO GND WHEN

TESTING tPHZ AND tPZH.

*Includes all probe and jig capacitance

Figure 7.

INPUT

Figure 8. INPUT EQUIVALENT CIRCUIT

ORDERING INFORMATION

Device

Package

Shipping†

MC74LVX541DW

SOIC−20

38 Units / Rail

MC74LVX541DWG

SOIC−20

(Pb−Free)

38 Units / Rail

MC74LVX541DTR2

TSSOP−20*

2500 Tape & Reel

MC74LVX541M

SOEIAJ−20

40 Units / Rail

MC74LVX541MG

SOEIAJ−20

(Pb−Free)

40 Units / Rail

MC74LVX541MEL

SOEIAJ−20

2000 Tape & Reel

MC74LVX541MELG

SOEIAJ−20

(Pb−Free)

2000 Tape & Reel

†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging

Specifications Brochure, BRD8011/D.

*This package is inherently Pb−Free.

http://onsemi.com

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