M28LV64 データシートの表示（PDF） - STMicroelectronics
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M28LV64 Datasheet PDF : 18 Pages
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M28LV64
AC MEASUREMENT CONDITIONS
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
≤ 20ns
0V to VCC -0.3V
1.5V
Note that Output Hi-Z is defined as the point where data
is no longer driven.
Figure 7. AC Testing Input Output Waveforms
VCC –0.3V
0V
0.5 VCC
AI01274
Figure 8. AC Testing Equivalent Load Circuit
VCC
DEVICE
UNDER
TEST
1.3kΩ
1.8kΩ
OUT
CL = 100pF
CL includes JIG capacitance
AI01396
Table 4. Capacitance (1) (TA = 25 °C, f = 1 MHz )
Symbol
Parameter
Test Condition
CIN
Input Capacitance
COUT
Output Capacitance
Note: 1. Sampled only, not 100% tested.
VIN = 0V
VOUT = 0V
Min
Max
Unit
6
pF
12
pF
Table 5. Read Mode DC Characteristics
(TA = 0 to 70°C or –40 to 85°C; VCC = 2.7V to 3.6V)
Symbol
Parameter
Test Condition
ILI
ILO
ICC (1)
Input Leakage Current
Output Leakage Current
Supply Current
(CMOS inputs)
ICC2 (1)
Supply Current (Standby)
CMOS
0V ≤ VIN ≤ VCC
0V ≤ VIN ≤ VCC
E = VIL, G = VIL, f = 5 MHz, VCC = 3.3V
E = VIL, G = VIL, f = 5 MHz, VCC = 3.6V
E > VCC –0.3V
VIL
Input Low Voltage
VIH Input High Voltage
VOL Output Low Voltage
IOL = 1 mA
VOH Output High Voltage
Note: 1. All I/O’s open circuit.
IOH = 1 mA
Min
– 0.3
2
0.8 VCC
Table 6. Power Up Timing (1) (TA = 0 to 70°C or –40 to 85°C; VCC = 2.7V to 3.6V)
Symbol
Parameter
Min
tPUR
Time Delay to Read Operation
1
tPUW
Time Delay to Write Operation (once VCC ≥ 4.5V)
15
VWI
Write Inhibit Threshold
1.5
Note: 1. Sampled only, not 100% tested.
Max
1019
10
8
10
20
0.6
VCC +0.5
0.2 VCC
Unit
µA
µA
mA
mA
µA
V
V
V
V
Max
Unit
µs
ms
2.5
V
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