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HN58S65AT-15 データシートの表示(PDF) - Hitachi -> Renesas Electronics

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HN58S65AT-15
Hitachi
Hitachi -> Renesas Electronics Hitachi
HN58S65AT-15 Datasheet PDF : 18 Pages
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HN58S65A Series
Write Cycle
Parameter
Symbol Min*2 Typ
Test
Max
Unit conditions
Address setup time
t AS
0
ns
Address hold time
t AH
150
ns
CE to write setup time (WE controlled) tCS
0
ns
CE hold time (WE controlled)
t CH
0
ns
WE to write setup time (CE controlled) tWS
0
ns
WE hold time (CE controlled)
t WH
0
ns
OE to write setup time
t OES
0
ns
OE hold time
t OEH
0
ns
Data setup time
t DS
150
ns
Data hold time
t DH
0
ns
WE pulse width (WE controlled)
t WP
200
ns
CE pulse width (CE controlled)
t CW
200
ns
Data latch time
t DL
200
ns
Byte load cycle
t BLC
0.4
30
µs
Byte load window
t BL
100
µs
Write cycle time
t WC
15*3
ms
Time to device busy
t DB
120
ns
Write start time
t DW
0*4
ns
Notes: 1. tDF is defined as the time at which the outputs achieve the open circuit conditions and are no
longer driven.
2. Use this device in longer cycle than this value.
3. tWC must be longer than this value unless polling techniques or RDY/Busy are used. This
device automatically completes the internal write operation within this value.
4. Next read or write operation can be initiated after tDW if polling techniques or RDY/Busy are
used.
5. A6 through A12 are page addresses and these addresses are latched at the first falling edge
of WE.
6. A6 through A12 are page addresses and these addresses are latched at the first falling edge
of CE.
7. See AC read characteristics.

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