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HN58V65A データシートの表示(PDF) - Hitachi -> Renesas Electronics

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HN58V65A Datasheet PDF : 27 Pages
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HN58V65A Series, HN58V66A Series
Write Cycle 1 (VCC = 2.7 to 4.5 V)
Parameter
Symbol Min*3 Typ Max Unit Test conditions
Address setup time
t AS
0
ns
Address hold time
t AH
50
ns
CE to write setup time (WE controlled)
t CS
0
ns
CE hold time (WE controlled)
t CH
0
ns
WE to write setup time (CE controlled)
t WS
0
ns
WE hold time (CE controlled)
t WH
0
ns
OE to write setup time
t OES
0
ns
OE hold time
t OEH
0
ns
Data setup time
t DS
50
ns
Data hold time
t DH
0
ns
WE pulse width (WE controlled)
t WP
200 —
ns
CE pulse width (CE controlled)
t CW
200 —
ns
Data latch time
t DL
100 —
ns
Byte load cycle
t BLC
0.3 —
30
µs
Byte load window
t BL
100 —
µs
Write cycle time
t WC
10*4 ms
Time to device busy
t DB
120 —
ns
Write start time
t DW
0*5
ns
Reset protect time*2
t RP
100 —
µs
Reset high time*2, 6
t RES
1
µs
Notes: 1. tDF and tDFR are defined as the time at which the outputs achieve the open circuit conditions
and
are no longer driven.
2. This function is supported by only the HN58V66A series.
3. Use this device in longer cycle than this value.
4. tWC must be longer than this value unless polling techniques or RDY/Busy are used. This
device automatically completes the internal write operation within this value.
5. Next read or write operation can be initiated after tDW if polling techniques or RDY/Busy are
used.
6. This parameter is sampled and not 100% tested.
7. A6 through A12 are page addresses and these addresses are latched at the first falling edge
of WE.
8. A6 through A12 are page addresses and these addresses are latched at the first falling edge
of CE.
9. See AC read characteristics.

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