NB6L14MNR2G データシートの表示（PDF） - ON Semiconductor

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NB6L14MNR2G

2.5 V/3.3 V3.0 GHz Differential 1:4 LVPECL Fanout Buffer

ON Semiconductor 

NB6L14

Table 3. ATTRIBUTES

Characteristics

ESD Protection

Human Body Model

Machine Model

Moisture Sensitivity (Note 2)

QFN−16

Flammability Rating

Oxygen Index: 28 to 34

Transistor Count

Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test

2. For additional information, see Application Note AND8003/D.

Value

> 4 kV

> 100 V

Level 1

UL 94 V−0 @ 0.125 in

Table 4. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

VCC

Positive Power Supply

GND = 0 V

VIo

Positive Input/Output

GND = 0 V

IIN

Input Current

Source or Sink Current (IN/IN)

4.0

V

−0.5 V v VIo v VCC + 0.5 V

4.0

V

"50

mA

IVREF_AC

IOUT

Source or Sink Current on VT Pin

Output Current

Continuous

Surge

"2.0

mA

50

mA

100

mA

TA

Operating Temperature Range

Tstg

Storage Temperature Range

qJA

Thermal Resistance

(Junction−to−Ambient) (Note 3)

0 lfpm

500 lfpm

QFN−16

QFN−16

−40 to +85

−65 to +150

42

35

°C

°C

°C/W

°C/W

qJC

Thermal Resistance (Junction−to−Case) (Note 3)

QFN−16

4

°C/W

Tsol

Wave Solder

Pb−Free

265

°C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

3. JEDEC standard multilayer board − 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad.

http://onsemi.com

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