NCP1207 データシートの表示（PDF） - ON Semiconductor

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NCP1207

PWM Current-Mode Controller for Free Running Quasi-Resonant Operation

ON Semiconductor 

NCP1207

HV

7.0

mA

VCC

PON

+−

+

12 V, 10 V,

5.3 V (fault)

4.5 ms

Delay

OVP

Demag

+

5.0 V

/1.44

−+

8.0 ms

Blanking

SQ

S*

R* R Q

−

+

Rint

+

50 mV

Resd

10 V

Demag

VCC

Driver: src = 20

sink = 10

Drv

4.2 V

GND

To Internal

Supply

Fault

Mngt.

Overload?

Soft−Start = 1 ms

+

/3

FB

−

1.0 V 200 mA

when Drv

is OFF

*S and R are level triggered whereas S is edge

triggered. R has priority over the other inputs.

5.0 ms

Timeout

Timeout

Reset

380 ns

L.E.B.

CS

Demag

Figure 2. Internal Circuit Architecture

ÁÁÁÁÁÁMPoAwÁÁÁXeIrMSÁÁÁUupMpÁÁÁlyRVAoTÁÁÁltIaNgGeÁÁÁS ÁÁÁÁÁÁÁÁÁRÁÁÁatinÁÁÁg ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁVSCyÁÁCÁm,bDoÁÁrÁvl ÁÁÁÁÁÁÁÁÁVa1ÁÁl6Áue ÁÁÁÁÁÁÁÁÁUÁÁnÁVitsÁÁÁ

Maximum Voltage on all other pins except Pin 8 (HV), Pin 6 (VCC) Pin 5 (Drv) and

−

Pin 1 (Demag)

−0.3 to 10

V

Maximum Current into all pins except VCC (6), HV (8) and Demag (1) when 10 V

−

ESD diodes are activated

5.0

mA

Maximum Current in Pin 1

Idem

+3.0/−2.0

mA

Thermal Resistance, Junction−to−Case

RqJC

57

°C/W

Thermal Resistance, Junction−to−Air, SOIC version

RqJA

178

°C/W

Thermal Resistance, Junction−to−Air, PDIP version

ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ Operating Junction Temperature

ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ Maximum Junction Temperature

RqJA

TJ

TJMAX

100

−40 to +125

150

°C/W

°C

°C

Temperature Shutdown

−

155

°C

Hysteresis in Shutdown

−

30

°C

Storage Temperature Range

−

−60 to +150

°C

ESD Capability, HBM Model (All pins except HV)

−

2.0

kV

ESD Capability, Machine Model

−

200

V

Maximum Voltage on Pin 8 (HV), Pin 6 (VCC) decoupled to ground with 10 mF

VHVMAX

500

V

Minimum Voltage on Pin 8 (HV), Pin 6 (VCC) decoupled to ground with 10 mF

VHVMIN

40

V

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit

values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,

damage may occur and reliability may be affected.

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