NCV8460 データシートの表示（PDF） - ON Semiconductor
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NCV8460 Datasheet PDF : 16 Pages
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NCV8460
ELECTRICAL CHARACTERISTICS (8 ≤ VD ≤ 36 V; −40°C < TJ < 150°C unless otherwise specified)
Value
Rating
Operating Supply
Voltage
Symbol
VD
Conditions
Min
Typ
Max
Unit
6
−
36
V
Undervoltage Shutdown
Undervoltage
Overvoltage Shutdown
On Resistance
Standby Current
VUV
VUV_Rst
VOV
RON
ID
Iout = 2 A; TJ = 25°C, VD > 6 V
Iout = 2 A, VD > 6 V
Off State, Vin = Vout = 0 V, VD = 13.5 V
On State; Vin = 5 V, VD = 13.5 V, Iout = 0 A
3
4
5.5
V
6
V
36
V
60
mW
120
10
20
mA
1.5
3.5
mA
Output Leakage Current
IL
INPUT CHARACTERISTICS
Vin = Vout = 0 V
Vin = 0 V, Vout = 3.5 V
−20
Vin = Vout = 0 V, VD = 13.5 V
50
mA
10
3
Input Voltage − Low
Input Current − Low
Input Voltage − High
Input Current − High
Input Hysteresis Voltage
Input Clamp Voltage
Vin_low
Iin_low
Vin_high
Iin_high
Vhyst
Vin_cl
SWITCHING CHARACTERISTICS
Vin = 1.25 V
Vin = 3.25 V
Iin = 1 mA
Iin = −1 mA
1.25
V
1
mA
3.25
V
10
mA
0.25
V
V
11
12
13
−13
−12
−11
Turn−On Delay Time
td_on
to 10% Vout, VD = 13.5 V, RL = 6.5 W
Turn−Off Delay Time
td_off
to 90% Vout, VD = 13.5 V, RL = 6.5 W
Slew Rate On
dVout / dton
10% to 80% Vout, VD = 13.5 V, RL = 6.5 W
Slew Rate Off
dVout / dtoff
90% to 10% Vout, VD = 13.5 V, RL = 6.5 W
OUTPUT DIODE CHARACTERISTICS (Note 3)
40
ms
30
ms
0.9
V / ms
0.7
V / ms
Forward Voltage
VF
STATUS PIN CHARACTERISTICS
Iout = −1.3 A, TJ = 150°C
0.6
V
Status Output Voltage
Low
Vstat_low
Istat = 1.6 mA
0.2
0.5
V
Status Leakage Current
Status Pin Input
Capacitance
Istat_leakage
Cstat
Vstat = 5 V
Vstat = 5 V (Note 3)
1
10
mA
100
pF
Status Clamp Voltage
Vstat_cl
Istat =1 mA
Istat = −1 mA
10
11
12
V
−2.2 −1.2 −0.6
PROTECTION FUNCTIONS (Note 4)
Temperature Shutdown
TSD
(Note 3)
150
175
200
°C
Temperature Shutdown
Hysteresis (Note 3)
TSD_hyst
7
15
°C
Output Current Limit
Ilim
8 V < VD < 36 V
6
9
15
A
6 V < VD < 36 V
5
15
A
Status Delay in Overload
td_stat
20
ms
3. Not subjected to production testing
4. To ensure long term reliability under heavy overload or short circuit conditions, protection and related diagnostic signals must be used
together with a proper hardware/software strategy. If the devices operates under abnormal conditions this hardware/software solutions
must limit the duration and number of activation cycles.
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