NE5210 データシートの表示（PDF） - Philips Electronics

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NE5210

Transimpedance amplifier (280MHz)

Philips Electronics 

Philips Semiconductors

Transimpedance amplifier (280MHz)

Product specification

NE5210

TEST CIRCUITS (Continued)

Typical Differential Output Voltage

vs Current Input

5V

IIN (µA)

OUT +

IN DUT

OUT –

GND1

GND2

+

VOUT (V)

–

2.00

1.60

1.20

0.80

0.40

0.00

–0.40

–0.80

–1.20

–1.60

–2.00

–400

–320

–240

–160

–80

0

80

CURRENT INPUT (µA)

160

240

320

400

NE5210 TEST CONDITIONS

Procedure 1

RT measured at 60µA

RT = (VO1 – VO2)/(+60µA – (–60µA))

Where: VO1 Measured at IIN = +60µA

VO2 Measured at IIN = –60µA

Procedure 2

Linearity = 1 – ABS((VOA – VOB) / (VO3 – VO4))

Where: VO3 Measured at IIN = +120µA

VO4 Measured at IIN = –120µA

VOA + RT @ () 120mA) ) VOB

VOB + RT @ (* 120mA) ) VOB

Procedure 3

VOMAX = VO7 – VO8

Where: VO7 Measured at IIN = +260µA

VO8 Measured at IIN = –260µA

Procedure 4

IIN Test Pass Conditions:

VO7 – VO5 > 20mV and V06 – VO5 > 20mV

Where: VO5 Measured at IIN = +160µA

VO6 Measured at IIN = –160µA

VO7 Measured at IIN = +260µA

VO8 Measured at IIN = –260µA

Test Circuit 8

1995 Apr 26

7

SD00323

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