PI49FCT20807 データシートの表示（PDF） - Pericom Semiconductor

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PI49FCT20807

1-10 Clock Buffer for Networking Applications

Pericom Semiconductor 

PI49FCT20807

1-10 Clock Buffer for

Networking Applications 1122334455667788990011223344556677889900112233445566778899001122112233445566778899001122334455667788990011223344556677889900112211223344556677889900112233445566778899001122334455667788990011221122334455667788990011223344556677889900112233445566778899001122112233445566778899001122

Graph 1. Dynamic Current vs. Clock Frequency

160

140

120

100

80

60

40

20

0

0

Load = 15pF & 33 ohms

Load = 0

50

100

150

Clock Frequency [MHz]

Capacitance (TA = 25°C, f = 1 MHz)

Parameters(1)

Description

Test Conditions

Typ.

CIN

Input Capacitance

VIN = 0V

3

COUT

Output Capacitance

VOUT = 0V

Note:

1. This parameter is determined by device characterization but is not production tested.

Switching Characteristics (VDD = 2.5V ± 0.2V, TA = 85°C)

Parameters

Description

Test Conditions(1)

tR/tF

CLKn Rise/Fall Time 0.7V ~ 1.7 V

tPLH

tPHL

Propagation Delay BUF_IN to CLKn

tSK(o)(2)

Skew between two outputs of the same package

(same transition)

tSK(p)(2)

Skew between opposite transitions (tPHL-tPLH)

of the same output

tSK(t)(2) Skew between two outputs of different package (4)

Notes:

1. See test circuit and waveforms.

2. Skew measured at worse cast temperature (max. temp).

CL = 22pF, 100 MHz

CL = 12pF, 150 MHz

CL = 22pF, 100 MHz

CL = 12pF, 150 MHz

CL = 22pF, 100 MHz

CL = 12pF, 150 MHz

CL = 22pF, 100 MHz

CL = 12pF, 150 MHz

CL = 12pF, 150 MHz

Test Circuits for All Outputs

200

Max.

4

6

Units

pF

Min.

–

–

–

–

–

–

–

–

–

Typ. Max. Units

1.0 1.25

1.0 1.2

ns

3.0 3.5

2.4 2.7

100 150

100 150

250 300 ps

250 300

400 600

VDD

VIN

VOUT

Pulse

Generator

D.U.T.

CL

Definitions:

CL = Load capacitance: includes jig and probe capacitance.

3

PS8558B 09/24/04

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