DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

SAFC826.5T877.5MF1D0T データシートの表示(PDF) - Murata Manufacturing

部品番号
コンポーネント説明
メーカー
SAFC826.5T877.5MF1D0T
Murata
Murata Manufacturing Murata
SAFC826.5T877.5MF1D0T Datasheet PDF : 5 Pages
1 2 3 4 5
CERAMIC MICROWAVE FILTERS
SAW FILTERS
ENVIRONMENTAL SPECIFICATIONS
SAF Series
MECHANICAL
TEST ITEM
Terminal Strength
Solderability
Random Drop
Vibration
PACKAGE
SMD
LEADED
BOTH
BOTH
BOTH
TEST CONDITIONS
Filter is soldered onto the center of PCB which is laid on two small supporters
spaced 90mm apart. The PCB is deflected to 1mm below the horizontal level by the
pressing stick for 1 second and repeated 5 times.
A force of 1.0 Kg shall be applied to each terminal in the direction of the axis of
terminal for 30 ± 5 seconds.
A force of 250 gf is applied to each lead in axial direction. The lead shall be bent
90 degrees to one direction, then in opposite direction and returned to the
original position.
Lead terminals are immersed in methanol with 7 to 10% of rosin flux for about
5 seconds, then immersed in soldering bath at 230 ± 5°C for 5 ± 0.5 seconds.
Drop 3 times on concrete floor from 1.0 meter, (30cm for some products).
Vibration amplitude of 1.5mm at 10-55Hz in each of three mutually
perpendicular directions for 1 hour.
TEST METHOD
MIL-STD-202E
Method 208C
MIL-STD-201E
Method 201A
ENVIRONMENTAL
TEST ITEM
Salt Spray
Temperature Cycling
Humidity
Operating Humidity
Thermal Shock
Life Test (High)
Life Test (Low)
Operating Life Test
Sulfuration
Resistance to
Soldering Heat
PACKAGE
BOTH
BOTH
BOTH
BOTH
BOTH
BOTH
BOTH
BOTH
BOTH
SMD
LEADED
TEST CONDITIONS
Hold in chamber with 5% salt density at 35°C +1.1°/–1.7°C for 48 hours.
Measure after exposure to room condition for 1 hour.
Exposure to 5 cycles of –55°C (30 minutes) ¡+25°C (15 minutes), ±85°C
(30 minutes) ¡+25°C (15 minutes). Test after 2 hours exposure to room conditions.
Hold in chamber with 90 to 95% R.H. at 40 ± 2°C for 100 hours. Test after 2
hours exposure to room conditions.
Hold in chamber with 90 to 95% R.H. at 40 ± 2°C for 100 hours at 6VDC.
Test after 2 hours exposure to room conditions.
Expose to 5 cycles of –55°C (30 minutes) ¡+85°C (30 minutes). Test after 2 hours
exposure to room conditions.
Hold in chamber at 85 ± 2°C for 100 hours. Test after exposure to room
conditions for 2 hours.
Hold in chamber at –30 ± 2°C for 100 hours. Test after exposure to room
conditions for 2 hours.
Hold in chamber at 85 ± 2°C for 100 hours at 6VDC. Test after exposure to room
conditions for 2 hours.
Hold in chamber with 1000ppm sulfur density for 24 hours. Test after exposure
to room conditions for 2 hours.
Filter shall be preheated at 150 ± 20°C for 60 seconds, immersed whole
electrode in soldering bath at 240 ± 5°C for 3 ± 1 seconds, then measured after
exposure to room conditions for 2 hours.
Lead terminals are immersed up to 1.5mm from package base in soldering bath
at 260 ± 5°C for 10 ± 1 seconds, then measured after exposure to room
conditions for 2 hours.
TEST METHOD
MIL-STD-202E
Method 101D
MIL-STD-202E
Method 102A
MIL-STD-202E
Method 103B
MIL-STD-202E
MIL-STD-202E
Method 107D
MIL-STD-202E
Method 108A
MIL-STD-202E
Method 108A
MIL-STD-202E
Method 210A
ELECTRICAL
TEST ITEM
Dielectric Withstanding
Voltage
Insulation Resistance
Temperature
Characteristics
PACKAGE
BOTH
BOTH
SMD
LEADED
TEST CONDITIONS
Apply 100VDC between I/O terminals and ground terminal, for 1 minute.
Apply 100VDC between I/O terminals and ground terminal, for 1 minute.
Filter shall be measured between –10°C to +60°C temperature range.
Filter shall be measured between –10°C to +50°C temperature range.
TEST METHOD
MIL-STD-202E
MIL-STD-202E
Method 302
354
CG01-I

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]