CF5009AH1 データシートの表示（PDF） - Nippon Precision Circuits

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CF5009AH1

Crystal Oscillator Module ICs

Nippon Precision Circuits  

SM5009 series

5009AH× series

3V operation: VDD = 2.7 to 3.3V, VSS = 0V, Ta = −20 to 80°C unless otherwise noted.

Parameter

Symbol

Condition

HIGH-level output voltage

LOW-level output voltage

HIGH-level input voltage

LOW-level input voltage

Output leakage current

Current consumption

INH pull-up resistance

Negative resistance

Feedback resistance

Built-in capacitance

VOH Q: Measurement cct 1, IOH = 2mA

VOL Q: Measurement cct 1, IOL = 2mA

VIH INH

VIL INH

Q: Measurement cct 2, INH = LOW, VOH = VDD

IZ

Q: Measurement cct 2, INH = LOW, VOL = VSS

SM5009AH1S

CF5009AH1

INH = open, Measurement cct 3,

IDD load cct 2, CL = 15pF,

16MHz crystal oscillator

SM5009AH2S

CF5009AH2

SM5009AH3S

CF5009AH3

SM5009AH4S

CF5009AH4

RUP Measurement cct 4, VDD = 3V, INH = VSS

−RL VDD = 3V, Ta = 25°C, 16MHz

Rf Measurement cct 5

CG

Design value. A monitor pattern on a wafer is tested.

CD

Rating

Unit

min typ max

2.2

–

–

V

–

–

0.4

V

2.0

–

–

V

–

–

0.3

V

–

–

10

µA

–

–

10

–

4.5

10

–

3

7

mA

–

1.5

3.5

40

–

200 kΩ

–

–450

–

Ω

0.4

–

1.1 MΩ

5.58

6

6.42 pF

9.3

10 10.7 pF

5V operation: VDD = 4.5 to 5.5V, VSS = 0V, Ta = −40 to 85°C unless otherwise noted.

Parameter

Symbol

Condition

HIGH-level output voltage

LOW-level output voltage

HIGH-level input voltage

LOW-level input voltage

Output leakage current

Current consumption

INH pull-up resistance

Negative resistance

Feedback resistance

Built-in capacitance

VOH Q: Measurement cct 1, IOH = 4mA

VOL Q: Measurement cct 1, IOL = 4mA

VIH INH

VIL INH

IZ

Q: Measurement cct 2, INH = LOW, VOH = VDD

Q: Measurement cct 2, INH = LOW, VOL = VSS

SM5009AH1S

CF5009AH1

INH = open, Measurement cct 3,

IDD load cct 2, CL = 15pF,

30MHz crystal oscillator

SM5009AH2S

CF5009AH2

SM5009AH3S

CF5009AH3

SM5009AH4S

CF5009AH4

RUP Measurement cct 4, VDD = 5V, INH = VSS

−RL VDD = 5V, Ta = 25°C, 30MHz

Rf Measurement cct 5

CG Design value. A monitor pattern on a wafer is tested.

CD

Rating

Unit

min typ max

4.0

–

–

V

–

–

0.4

V

2.0

–

–

V

–

–

0.8

V

–

–

10

µA

–

–

10

–

9

20

–

6

13

mA

–

4

9

40

–

200 kΩ

–

–340

–

Ω

0.4

–

1.1 MΩ

5.58

6

6.42 pF

9.3

10 10.7 pF

NIPPON PRECISION CIRCUITS INC.—11

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