CF5009AH1 データシートの表示（PDF） - Nippon Precision Circuits

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CF5009AH1

Crystal Oscillator Module ICs

Nippon Precision Circuits  

SM5009 series

5009AN×/CN× series

3V operation: VDD = 2.7 to 3.3V, VSS = 0V, Ta = −20 to 80°C unless otherwise noted.

Parameter

Symbol

Condition

Rating

Unit

min typ max

SM5009AN1S, CF5009AN1

SM5009AN2S, CF5009AN2

2.2

–

–

SM5009AN3S, CF5009AN3

HIGH-level output voltage VOH Q: Measurement cct 1, IOH = 8mA SM5009AN4S, CF5009AN4

V

SM5009AN5S, CF5009AN5

SM5009AN6S, CF5009AN6

2.1

–

–

SM5009CN1S, CF5009CN1

SM5009CN2S, CF5009CN2

LOW-level output voltage VOL Q: Measurement cct 1, IOL = 8mA

–

–

0.4

V

HIGH-level input voltage

VIH INH

2.0

–

–

V

LOW-level input voltage

VIL INH

–

–

0.3

V

Output leakage current

Q: Measurement cct 2, INH = LOW, VOH = VDD

IZ

Q: Measurement cct 2, INH = LOW, VOL = VSS

–

–

10

µA

–

–

10

SM5009AN1S, CF5009AN1 –

8

17

SM5009AN2S, CF5009AN2 –

5

11

Current consumption

INH = open, Measurement cct 3, SM5009AN3S, CF5009AN3 –

4

9

load cct 2, CL = 15pF,

40MHz crystal oscillator

SM5009AN4S, CF5009AN4 –

3

7

IDD

SM5009AN5S, CF5009AN5 –

3

6

mA

SM5009AN6S, CF5009AN6 –

2

5

INH = open, Measurement cct 3, SM5009CN1S, CF5009CN1 –

load cct 2, CL = 15pF,

30MHz crystal oscillator,

Ta = –10 to +70°C

SM5009CN2S, CF5009CN2 –

7

15

4

9

INH pull-up resistance

Negative resistance

Feedback resistance

Built-in capacitance

RUP Measurement cct 4, VDD = 3V, INH = VSS

−RL VDD = 3V, Ta = 25°C, 40MHz

Rf Measurement cct 5

CG

Design value. A monitor pattern on a wafer is tested.

CD

40

–

200 kΩ

–

–100

–

Ω

0.4

–

1.1 MΩ

5.58

6

6.42 pF

9.3

10 10.7 pF

NIPPON PRECISION CIRCUITS INC.—8

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