MX27C2100 データシートの表示（PDF） - Macronix International

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MX27C2100

2M-BIT [256Kx8/128x16] CMOS EPROM

Macronix International 

SWITCHING TEST CIRCUITS

DEVICE

UNDER

TEST

MX27C2100/27C2048

CL

6.2K ohm

1.8K ohm

+5V

DIODES = IN3064

OR EQUIVALENT

CL = 100 pF including jig capacitance (30pF for MX27C2100/2048-70 and MX27C2048-55)

SWITCHING TEST WAVEFORMS

AC driving levels

2.0V

0.8V

TEST POINTS

INPUT

AC TESTING: AC driving levels are 3.0V/0V.

Input pulse rise and fall times are < 10ns.

2.0V

0.8V

OUTPUT

AC driving levels

1.5V

TEST POINTS

1.5V

INPUT

OUTPUT

AC TESTING: (1) AC driving levels are 3.0V/0V for commercial grade.

Input pulse rise and fall times are < 10ns.

(2) For MX27C2100/2048-70 and MX27C2048-55.

P/N: PM0158

REV. 4.3, AUG. 22, 2001

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