NE56632-XX データシートの表示（PDF） - Philips Electronics
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NE56632-XX Datasheet PDF : 16 Pages
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Philips Semiconductors
Active-LOW system reset with adjustable delay time
Product data
NE56632-XX
TYPICAL PERFORMANCE CURVES, NE56632-31 (continued)
36
37
34
35
32
30
28
26
Test Circuit 1
24 VCC1 = VS(min) – 0.05 V
VCC2 = 0.4 V
22
VO = 0.4 V
RL = 0 Ω
S2 = ON
20
–40
–20
0
20
40
60
80
100
AMBIENT TEMPERATURE, Tamb (°C)
SL01635
Figure 18. Output current (ON time 1) versus temperature.
33
31
Test Circuit 1
VCC1 = VS(min) – 0.05 V
29 VCC2 = 0.4 V
VO = 0.4 V
RL = 0 Ω
S2 = ON
27
–40
–20
0
20
40
60
80
100
AMBIENT TEMPERATURE, Tamb (°C)
SL01636
Figure 19. Output current (ON time 2) versus temperature.
180
Test Circuit 2
CL = 100 pF
160 RL = 4.7 kΩ
CD = 10 nF
140
120
100
80
60
40
–40
–20
VCC = (VS(typ) – 0.4 V) to (VS(typ)+ 0.4 V)
tPLH = Release Delay Time
0
20
40
60
80
100
AMBIENT TEMPERATURE, Tamb (°C)
SL01637
Figure 20. LOW-to-HIGH delay time versus temperature.
160
Test Circuit 2
150
CL = 100 pF
RL = 4.7 kΩ
CD = 10 nF
140
130
120
110
100
90
80
–40
–20
VCC = (VS(typ) + 0.4 V) to (VS(typ)– 0.4 V)
tPHL = Assertion Delay Time
0
20
40
60
80
100
AMBIENT TEMPERATURE, Tamb (°C)
SL01638
Figure 21. HIGH-to-LOW delay time versus temperature.
2002 Mar 25
8
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