SST58LD016-70-C-P1H データシートの表示（PDF） - Silicon Storage Technology
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SST58LD016-70-C-P1H Datasheet PDF : 40 Pages
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ATA-Disk Chip
SST58SD008 / 016 / 024 / 032 / 048 / 064 / 096 / 128 / 192
SST58LD008 / 016 / 024 / 032 / 048 / 064 / 096 / 128 / 192
Data Sheet
2.2 Absolute Maximum Stress Ratings
Absolute Maximum Stress Ratings (Applied conditions greater than those listed under “Absolute Maximum
Stress Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation
of the device at these conditions or conditions greater than those defined in the operational sections of this data
sheet is not implied. Exposure to absolute maximum stress rating conditions may affect device reliability.)
Temperature Under Bias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55°C to +125°C
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -50°C to +100°C
D.C. Voltage on any Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to VDD+0.5V
Transient Voltage (<20 ns) on Any Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -1.0V to VDD+1.0V
Package Power Dissipation Capability (Ta = 25°C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.0W
Through Hole Lead Soldering Temperature (10 Seconds). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 300°C
Surface Mount Lead Soldering Temperature (3 Seconds)
240°C
Output Short Circuit Current1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA
1. Outputs shorted for no more than one second. No more than one output shorted at a time.
OPERATING RANGE: SST58SDXXX
Range
Commercial
Ambient Temp
0°C to +70°C
VDD
4.5-5.5V
OPERATING RANGE: SST58LDXXX
Range
Commercial
Ambient Temp
0°C to +70°C
VDD
3.135-3.465V
AC CONDITIONS OF TEST
Input Rise/Fall Time . . . . . . . . . . . . . . 10 ns
Output Load . . . . . . . . . . . . . . . . . . . . CL = 100 pF
See Figures 2-3 and 2-4
Note: All AC specifications are guaranteed by design.
TABLE 2-3: RECOMMENDED SYSTEM POWER-UP TIMINGS
Symbol
Parameter
Maximum
Units
TPU-READY1
Power-up to Ready Operation
500
ms
TPU-WRITE1
Power-up to Write Operation
500
ms
T2-3.0 391
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 2-4: CAPACITANCE (Ta = 25°C, f=1 Mhz, other pins open)
Parameter
Description
Test Condition
Maximum
CI/O1
I/O Pin Capacitance
VI/O = 0V
15 pF
CIN1
Input Capacitance
VIN = 0V
9 pF
T2-4.0 391
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 2-5: RELIABILITY CHARACTERISTICS
Symbol
Parameter
Minimum Specification
Units Test Method
ILTH1
Latch Up
100 + IDD
mA JEDEC Standard 78
T2-5.1 391
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
©2001 Silicon Storage Technology, Inc.
9
S71167-05-000 9/01 391
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