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MJE243(2002) データシートの表示(PDF) - ON Semiconductor

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MJE243
(Rev.:2002)
ON-Semiconductor
ON Semiconductor ON-Semiconductor
MJE243 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
MJE243 MJE253
VCC
+ā30 V
+11 V
0
25 µs
-ā9.0 V
RB
51
RC
SCOPE
D1
tr, tf 10 ns
DUTY CYCLE = 1.0%
-ā4 V
RB and RC VARIED TO OBTAIN DESIRED CURRENT LEVELS
ąD1 MUST BE FAST RECOVERY TYPE, e.g.:
ąą1N5825 USED ABOVE IB 100 mA
ąąMSD6100 USED BELOW IB 100 mA
FOR PNP TEST CIRCUIT, REVERSE ALL POLARITIES
Figure 2. Switching Time Test Circuit
1K
500
300
tr
200
100
50
30
20
10
td
5
3
NPN MJE243
2
PNP MJE253
VCC = 30 V
IC/IB = 10
TJ = 25°C
1
0.01 0.02 0.03 0.05 0.1 0.2 0.3 0.5 1
2 3 5 10
IC, COLLECTOR CURRENT (AMPS)
Figure 3. Turn–On Time
1.0
0.7
D = 0.5
0.5
0.3
0.2
0.2
0.1
0.1
0.05
0.07
0.02
0.05
0.01
0.03
0.02 0 (SINGLE PULSE)
0.01
0.02
0.05
0.1
0.2
θJC(t) = r(t) θJC
θJC = 8.34°C/W MAX
D CURVES APPLY FOR POWER
PULSE TRAIN SHOWN
READ TIME AT t1
TJ(pk) - TC = P(pk) θJC(t)
P(pk)
t1
t2
DUTY CYCLE, D = t1/t2
0.5
1.0
2.0
5.0
10
20
t, TIME (ms)
Figure 4. Thermal Response
50
100
200
10
5.0
100õs 500õs
2.0
1.0Ăms
1.0
0.5
0.2
0.1
0.05
0.02
0.01
1.0
dc
TJ = 150°C
BONDING WIRE LIMITED
THERMALLY LIMITED @
TC = 25°C (SINGLE PULSE)
SECOND BREAKDOWN LIMITED
CURVES APPLY BELOW
ąRATED VCEO
5.0Ăms
MJE243/MJE253
2.0 3.0 5.0 7.0 10
20 30 50 70 100
VCE, COLLECTOR-EMITTER VOLTAGE (VOLTS)
Figure 5. Active Region Safe Operating Area
There are two limitations on the power handling ability of
a transistor: average junction temperature and second
breakdown. Safe operating area curves indicate IC – VCE
limits of the transistor that must be observed for reliable
operation; i.e., the transistor must not be subjected to greater
dissipation than the curves indicate.
The data of Figure 5 is based on TJ(pk) = 150_C; TC is
variable depending on conditions. Second breakdown pulse
limits are valid for duty cycles to 10% provided TJ(pk)
v 150_C. TJ(pk) may be calculated from the data in
Figure 4. At high case temperatures, thermal limitations will
reduce the power that can be handled to values less than the
limitations imposed by second breakdown.
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