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ULN2003G データシートの表示(PDF) - Unisonic Technologies

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コンポーネント説明
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ULN2003G
UTC
Unisonic Technologies UTC
ULN2003G Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
ULN2003
LINEAR INTEGRATED CIRCUIT
„ TEST CIRCUIT
Components in the test circuits are used only to obtain and confirm the device characteristics. These components
and circuits are not guaranteed to prevent malfunction or failure from occurring in the application equipment.
1. ILEAK
OPEN
VIN
OPEN
ILEAK
VCE
VIN
2. VCEO(SAT),hFE
OPEN
IIN
IOUT
VCE,VCEO(SAT)
hFE=
IOUT
IIN
3. IIN(ON)
IIN(ON)
VIN
OPEN
OPEN
4. IIN(OFF)
IIN(OFF)
OPEN
IOUT
5. VIN(ON)
OPEN
IOUT
VIN(ON)
VCE
6.
IR
OPEN
IR
VR
OPEN
UNISONIC TECHNOLOGIES CO., LTD
www.unisonic.com.tw
4 of 10
QW-R113-001.J

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