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VP2612CGGPFR データシートの表示(PDF) - Mitel Networks

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VP2612CGGPFR
Mitel
Mitel Networks Mitel
VP2612CGGPFR Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
VP2612
XCLK
VAL
TD
CTS
RDY
Line rate clock
Ready to send
Transmitted Data
Clear To Send
Receiver ready
Of these signals XCLK, CTS and RDY are supplied by
the receiving device, the latter two indicating that the receiver
is ready to accept data. The VAL line is used to signal that the
VMUX is ready to start transmitting valid data, and the TD line
provides the data. The signaling convention is as follows:
CTS = 1
RDY = 0
Receiving device not ready
CTS = 0
RDY = X
Receiving device ready to accept data
CTS =1
RDY =1
Receiving device ready to accept data
The VAL line is taken high by the reset input, and when
the receiving device signals that it is ready to accept data then
the VP2612 takes the VAL line low on a falling edge of an
XCLK. The data is then clocked out on subsequent falling
edges of the XCLK signal, so that it can be sampled by the
receiver on the rising edge of the clock.
If a simple serial interface is required, the CTS input
should be tied low and the RDY input tied high. It is possible
to use a variable rate clock provided the maximum
instantaneous bit rate does not exceed 8Mbits/s, and the
average clock rate over 32 bits does not exceed 2Mbits/s.
Timing delays with respect to the incoming XCLK are shown
in Figure 6.
JTAG Test Interface
The VP2612 includes a test interface consisting of a
boundary scan loop of test registers placed between the pads
and the core of the chip. The control of this loop is fully JTAG/
IEEE 1149-1 1990 compatible. Please refer to this document
for a full description of the standard.
The interface has five dedicated pins: TMS, TDI, TDO,
TCK and TRST. The TRST pin is an independent reset for the
interface controller and should be pulsed low, soon after
power up; if the JTAG interface is not to be used it can be tied
low permanently. The TDI pin is the input for shifting in serial
instruction and test data; TDO the output for test data. The
TCK pin is the independent clock for the test interface and
registers, and TMS the mode select signal.
TDI and TMS are clocked in on the rising edge of TCK,
and all output transitions on TDO happen on its falling edge.
Instructions are clocked into the 3 bit instruction register
(no parity bit) and the following instructions are available.
Instruction Register
( MSB first )
Name
111
BYPASS
000
EXTEST
010
SAMPLE/PRELOAD
XCLK
I/P
READY FROM
RECEIVER
DATA VALID
O/P (VAL)
DATA
O/P
20 min
RECEIVER READY R =1, I =1
25ns max
25ns max
25ns max
DATA VALID
Figure 6. Serial Interface Timing
The TAP controller used in this device does not support
a separate INTEST instruction but allows EXTEST to drive the
internals of the device as well as to drive the output pins.
Output enables are thus present in the chain which are not
connected to pins but which allow EXTEST to be used to
control the impedance of all the outputs. The JTAG signal
TXD controls the TXD bus, HD controls the HD bus, and TOPS
controls all remaining outputs. The TOE pin, which can
separately be used to control the impedance of all the outputs,
can be monitored as an input through the scan chain but
cannot be used to control the outputs through the TAP
controller.
7

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