VP216 データシートの表示（PDF） - Zarlink Semiconductor Inc
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VP216 Datasheet PDF : 9 Pages
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VP216
AIN_(Q,I)
V ref.
Comparator
C
Latch
L
Clock to ADC
Output
Buffer
Output
Buffer
Data Out
CLKOUT
N-1
N
N+1
AIN_(Q,I)
CLKOUT
Tpw 1
Tpw 0
Data Outputs
N-1
N
Th
Tsu
N+1
TTL
Threshold
Fig.4 System timing diagram
ELECTRICAL CHARACTERISTICS DEFINITIONS
Analog Bandwidth
The analog input frequency at which the spectral power
of the fundamental frequency, as determined by FFT analysis
is reduced by 3dB.
Aperture Delay
The delay between the rising edge of the 90MHz clock
signal and the instant the analog input signal is sampled.
Aperture Jitter
The sample to sample variation in aperture delay.
Bit Error Rate (BER)
The number of spurious code errors produced for any
given input sinewave frequency at a given clock frequency. In
this case it is the number of codes occurring outside the
histogram cusp for a 1/2 FS sinewave.
Data Outputs, Set-up and Hold Time
Data output timings are measured from 2.4V and 0.4V to
the 1.4V threshold on the rising edge of the output clock.
Differential Non-linearity
The deviation in any code width from an ideal 1 LSB step.
Effective Number of Bits (ENOB)
This is a measure of a device's dynamic performance
and may be obtained from the SNR or from a sine wave
curve test fit according to the following expressions:
ENOB = SNR-1.76/6.02 or
ENOB = N-log2[rms error (actual)/rms error (ideal)]
where N is the conversion resolution and the actual rms error
is the deviation from an ideal sine wave, calculated from the
converter outputs with a sine wave input.
Integral Non-linearity (INL)
The deviation of the centre of each code from a
reference line which has been determined by a least squares
curve fit.
Signal-to-Noise Ratio (SNR)
The ratio of the rms signal amplitude to the rms value of
‘noise’ which is defined as the sum of all other spectral
components, including the harmonics, but excluding D.C.
with a full-scale analog input signal.
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