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VSC7186 データシートの表示(PDF) - Vitesse Semiconductor

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VSC7186
Vitesse
Vitesse Semiconductor Vitesse
VSC7186 Datasheet PDF : 16 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
VITESSE
SEMICONDUCTOR CORPORATION
Advance Product Information
VSC7186
Quad Transceiver
for Gigabit Ethernet
Absolute Maximum Ratings (1)
Power Supply Voltage, (VDD) ............................................................................................................-0.5V to +4V
DC Input Voltage (PECL inputs)............................................................................................ -0.5V to VDD +0.5V
DC Input Voltage (TTL inputs) ......................................................................................................... -0.5V to 5.5V
DC Output Voltage (TTL Outputs)........................................................................................ -0.5V to VDD + 0.5V
Output Current (TTL Outputs) ................................................................................................................. +/-50mA
Output Current (PECL Outputs)................................................................................................................+/-50mA
Case Temperature Under Bias .........................................................................................................-55o to +125oC
Storage Temperature..................................................................................................................... -65oC to +150oC
Maximum Input ESD (Human Body Model).............................................................................................. 2000 V
Recommended Operating Conditions
Power Supply Voltage, (VDD) ................................................................................................................+3.3V+5%
Operating Temperature Range ........................................................... 0oC Ambient to +100oC Case Temperature
Notes:
(1) CAUTION: Stresses listed under “Absolute Maximum Ratings” may be applied to devices one at a time without causing per-
manent damage. Functionality at or above the values listed is not implied. Exposure to these values for extended periods may
affect device reliability.
G52306-0, Rev. 2.0
3/27/00
VITESSE SEMICONDUCTOR CORPORATION
741 Calle Plano, Camarillo, CA 93012 805/388-3700 FAX: 805/987-5896
Page 9

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