WM8785GEDS(2005) データシートの表示（PDF） - Wolfson Microelectronics plc
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WM8785GEDS Datasheet PDF : 31 Pages
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Pre-Production
WM8785
Test Conditions
DVDD = 3.3V, AVDD = 5.0V, TA = +25oC, 1kHz signal, A-weighted, fs = 48kHz, MCLK = 256fs, 24-bit audio data, Slave Mode
unless otherwise stated.
PARAMETER
Supply Current
Analogue supply current
Digital supply current
Power Down
SYMBOL TEST CONDITIONS
MIN
TYP
MAX
27
5
22
Note:
1. VMID is decoupled with 10uF and 0.1uF capacitors close to the device package. Smaller capacitors may reduce
performance.
UNIT
mA
mA
uA
TERMINOLOGY
1. Signal-to-noise ratio (dB) – Ratio of output level with 1kHz full scale input, to the output level with all zeros into the
digital input, over a 20Hz to 20kHz bandwidth. (No Auto-zero or Automute function is employed in achieving these
results).
2. Dynamic range (dB) - DR is a measure of the difference between the highest and lowest portions of a signal. Normally
a THD+N measurement at 60dB below full scale. The measured signal is then corrected by adding the 60dB to it.
(e.g. THD+N @ -60dB= -32dB, DR= 92dB).
3. THD+N (dB) - THD+N is a ratio, of the rms values, of (Noise + Distortion)/Signal.
4. Channel Separation (dB) - Also known as Cross-Talk. This is a measure of the amount one channel is isolated from
the other. Normally measured by sending a full scale signal down one channel and measuring the other.
5. All performance measurements are done with a 20kHz low pass filter, and where noted an A-weight filter, except
where noted. Failure to use such a filter will result in higher THD+N and lower SNR and Dynamic Range readings than
are found in the Electrical Characteristics. The low pass filter removes out of band noise; although this is not audible,
it may affect dynamic specification values
w
PP Rev 3.0 December 2005
7
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