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ICX085AL データシートの表示(PDF) - Sony Semiconductor

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ICX085AL Datasheet PDF : 20 Pages
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ICX085AL
Image Sensor Characteristics Measurement Method
Measurement conditions
1) In the following measurements, the substrate voltage is set to the value indicated on the device, and the
device drive conditions are at the typical values of the bias and clock voltage conditions.
2) In the following measurements, spot blemishes are excluded and, unless otherwise specified, the optical
black level (OB) is used as the reference for the signal output, which is taken as the value measured at point
[B] of the measurement system.
Definition of standard imaging conditions
1) Standard imaging condition I:
Use a pattern box (luminance: 706cd/m2, color temperature of 3200K halogen source) as a subject. (Pattern
for evaluation is not applicable.) Use a testing standard lens with CM500S (t = 1.0 mm) as an IR cut filter
and image at F8. The luminous intensity to the sensor receiving surface at this point is defined as the
standard sensitivity testing luminous intensity.
2) Standard imaging condition II:
Image a light source (color temperature of 3200K) with a uniformity of brightness within 2% at all angles.
Use a testing standard lens with CM500S (t = 1.0 mm) as an IR cut filter. The luminous intensity is adjusted
to the value indicated in each testing item by the lens diaphragm.
1. Sensitivity
Set to standard imaging condition I. After selecting the electronic shutter mode with a shutter speed of
1/80s, measure the signal output (VS) at the center of the screen, and substitute the value into the following
formula.
S = VS x
80
12
[mV]
2. Saturation signal
Set to standard imaging condition II. After adjusting the luminous intensity to 10 times the intensity with the
average value of the signal output, 150mV, measure the minimum value of the signal output.
3. Smear
Set to standard imaging condition II. With the lens diaphragm at F5.6 to F8, first adjust the luminous
intensity to 500 times the intensity with the average value of the signal output, 150mV. Then after the
readout clock is stopped and the charge drain is executed by the electronic shutter at the respective H
blankings, measure the maximum value (VSm [mV]) of the signal output and substitute the value into the
following formula.
Sm =
VSm
150
x
1
500
x
1
10
x 100 [%] (1/10 V method conversion value)
– 10 –

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