ICX084AL データシートの表示（PDF） - Sony Semiconductor

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ICX084AL

Diagonal 6mm (Type 1/3) Progressive Scan CCD Image Sensor with Square Pixel for B/W Cameras

Sony Semiconductor 

Block Diagram and Pin Configuration

(Top View)

8

7

6

5

4

3

2

1

ICX084AL

Note)

Horizontal register

9 10 11 12 13 14 15 16

Note) : Photo sensor

Pin Description

Pin No. Symbol

Description

Pin No. Symbol

Description

1

Vφ3

Vertical register transfer clock

9

VDD

Supply voltage

2

Vφ2

Vertical register transfer clock

10

SUBCIR

Supply voltage for the substrate

voltage generation

3

Vφ1

Vertical register transfer clock

11 GND GND

4 NC

12 φSUB Substrate clock

5 GND GND

6

CGG

Output amplifier gate∗1

13 VL

14 RG

Protective transistor bias

Reset gate clock

7 GND GND

15 Hφ1

Horizontal register transfer clock

8

VOUT

Signal output

16 Hφ2

Horizontal register transfer clock

∗1 DC bias is applied within the CCD, so that this pin should be grounded externally through a capacitance of

1000pF or more.

Absolute Maximum Ratings

Item

Substrate clock φSUB – GND

Supply voltage

VDD, VOUT, CGG, SUBCIR – GND

VDD, VOUT, CGG, SUBCIR – φSUB

Clock input voltage

Vφ1, Vφ2, Vφ3 – GND

Vφ1, Vφ2, Vφ3 – φSUB

Voltage difference between vertical clock input pins

Ratings

–0.3 to +36

–0.3 to +18

–22 to +9

–15 to +16

to +10

to +15

Voltage difference between horizontal clock input pins

Hφ1, Hφ2 – Vφ3

Hφ1, Hφ2 – GND

Hφ1, Hφ2 – φSUB

VL – φSUB

Vφ2, Vφ3 – VL

RG – GND

to +16

–16 to +16

–10 to +15

–55 to +10

–65 to +0.3

–0.3 to +27.5

–0.3 to +20.5

Vφ1, Hφ1, Hφ2, GND – VL

Storage temperature

–0.3 to +17.5

–30 to +80

Operating temperature

–10 to +60

∗2 +24V (Max.) when clock width < 10µs, clock duty factor < 0.1%.

–2–

Unit Remarks

V

V

V

V

V

V

∗2

V

V

V

V

V

V

V

V

°C

°C

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