FSA2267(2007_03) データシートの表示（PDF） - Fairchild Semiconductor

部品番号

コンポーネント説明

メーカー

FSA2267
(Rev.:2007_03)

0.35Ω Low-Voltage Dual-SPDT Analog Switch

Fairchild Semiconductor 

ESD Protection

ESD Performance of the FSA2267/FSA2267A

FSA2267

■ HBM all pins 7.0kV

■ CDM all pins 1.0kV

FSA267A

■ HBM all pins 7.5kV

■ CDM all pins 1.0kV

Human Body Model

Figure 5 shows the schematic representation of the

Human Body Model ESD event. Figure 6 is the ideal

waveform representation of the Human Body Model. The

device is tested to JEDEC: JESD22-A114 Human Body

Model.

Charged Device Model

In manufacturing test and handling environments, a

more useful model is the Charged Device Model and the

FSA2267/FSA2267A has a very good ESD immunity to

this model. The device is tested to JEDEC: JESD22-

C101 Charged Device Model.

IEC 61000-4-2

The IEC 61000-4-2 standard covers ESD testing and

performance of finished equipment and evaluates the

equipment in its entirety for ESD immunity. Fairchild

Semiconductor has evaluated this device using the

IEC 6100-4-2 representative system model depicted in

Figure 7.

ESD values measured via the IEC 61000-4-2 evaluation

method are influenced by the specific board layout,

board size, and many other factors of the manufacturer’s

product application. Measured system ESD values can-

not be guaranteed by Fairchild Semiconductor to exactly

correlate to a manufacturer’s in-house testing due to

these application environment variables. Fairchild Semi-

conductor has been able to determine that, for ultra-por-

table applications, an enhanced ESD immunity, relative

to the IEC 61000-4-2 specification, can be achieved with

the inclusion of a 100Ω−series resistor in the VCC supply

path to the analog switch (see Figure 8). Typical

improvements of between 3-6kV of ESD immunity (I/O to

GND) have been measured with the inclusion of the

resistor with the IEC 61000-4-2 representative model.

For more information on ESD testing methodologies,

please refer to:

AN-6019 Fairchild Analog Switch Products ESD Test

Methodology Overview

http://www.fairchildsemi.com/an/AN/AN-6019.pdf.

Additional ESD Test Conditions

For information regarding test methodologies and perfor-

mance levels, please contact Fairchild Semiconductor.

Figure 5. Human Body ESD Test Model

Figure 6. HBM Current Waveform

Figure 7. IEC 61000-4-2 ESD Test Model

Analog Switch Supply Rail

100

1B0

1B1

2B0

VCC

1A

1S

ESD Event

2B1

2A

2S

Ultra-portable Connector

Figure 8. ESD Immunity with 100Ω Resistor

© 2005 Fairchild Semiconductor Corporation

FSA2267 / FSA2267A Rev. 1.0.3

4

www.fairchildsemi.com

Share Link: