FQB6N80TM データシートの表示（PDF） - Fairchild Semiconductor
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FQB6N80TM Datasheet PDF : 8 Pages
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Same Type
VGS
50KΩ
as DUT
12V
200nF
300nF
10V
Qg
VGS
VDS
Qgs
Qgd
IG = co3nmsAt.
DUT
Charge
Figure 12. Gate Charge Test Circuit & Waveform
V10GVS
VDS
VGS
RG
RL
VDD
DUT
VDS
90%
VGS 10%
td(on)
tr
t on
td(off)
tf
t off
Figure 13. Resistive Switching Test Circuit & Waveforms
V1G0GVSS
tp
VDS
ID
RG
L
EAS = --21-- L IAS2
------B--V--D--S-S-------
BVDSS - VDD
BVDSS
IAS
VDD
ID (t)
DUT
VDD
VDS (t)
tp
Time
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms
©2008 Fairchild Semiconductor Corporation
5
FQB6N80 Rev. C1
www.fairchildsemi.com
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