74AHC1G00GV データシートの表示（PDF） - NXP Semiconductors.
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74AHC1G00GV Datasheet PDF : 12 Pages
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12. Waveforms
74AHC1G00; 74AHCT1G00
2-input NAND gate
$%LQSXW
<RXWSXW
90
W3+/
90
Measurement points are given in Table 9.
Fig 5. The inputs (A and B) to output (Y) propagation delays
Table 9. Measurement point
Type
Input
VI
74AHC1G00
GND to VCC
74AHCT1G00
GND to 3.0 V
VM
0.5 VCC
1.5 V
W3/+
PQD
Output
VM
0.5 VCC
0.5 VCC
38/6(
9,
*(1(5$725
9&&
92
'87
57
&/
PQD
Fig 6.
Test data is given in Table 8. Definitions for test circuit:
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
Test circuit for measuring switching times
74AHC_AHCT1G00
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 5 November 2014
© Nexperia B.V. 2017. All rights reserved
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