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AMIS-30511 データシートの表示(PDF) - ON Semiconductor

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AMIS-30511
ON-Semiconductor
ON Semiconductor ON-Semiconductor
AMIS-30511 Datasheet PDF : 28 Pages
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AMIS30511
Table 1. Pin List and Descriptions
Name
Pin
DO
1
VDD
2
GND
3
DI
4
CLK
5
NXT
6
DIR
7
ERR
8
SLA
9
CPN
10
CPP
11
VCP
12
CLR
13
CS
14
VBB
15
MOTYP
16
GND
17
MOTYN
18
MOTXN
19
GND
20
MOTXP
21
VBB
22
/
23
TST0
24
Description
SPI data output (open drain)
Logic Supply Input (needs external decoupling capacitor)
Ground
SPI data in
SPI clock input
Next microstep input
Direction input
Error Output (open drain)
Speed Load Angle Output
Negative connection of charge pump capacitor
Positive connection of charge pump capacitor
Chargepump filtercapacitor
“Clear” = Chip Reset input
SPI chip select input
High Voltage Supply Input
Negative end of phase Y coil output
Ground
Positive end of phase Y coil output
Positive end of phase X coil output
Ground
Negative end of phase X coil output
High Voltage Supply Input
No Function (to be left open in normal operation)
Test pin (to be tied to ground in normal operation) input
Table 2. Absolute Maximum Ratings
Symbol
Parameter
Min.
Max.
Units
VBB
VDD
Tstrg
Analog DC supply voltage (Note 1)
Logic supply voltage
Storage temperature
0.3
+40
V
0.3
+7.0
V
55
+160
°C
Tamb
Ambient temperature under bias
50
+150
°C
VESD
Electrostatic discharges on component level (Note 2)
2
+2
kV
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. For limited time < 0.5 s.
2. Human body model (100 pF via 1.5 kW, according to JEDEC EIAJESD22A114B).
Table 3. Recommended Operating Conditions
Symbol
Parameter
Min.
Max.
Units
VBB
Analog DC supply
VDD
Logic supply voltage
Ta
Ambient temperature VBB +18
Ta
Ambient temperature VBB +30
Tj
Junction temperature
+6
+30
V
4.75
5.25
V
40
+125
°C
40
+85
°C
+160
°C
NOTE: Operating ranges define the limits for functional operation and parametric characteristics of the device. Note that the functionality
of the chip outside these operating ranges is not guaranteed. Operating outside the recommended operating ranges for extended
periods of time may affect device reliability.
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