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5962-9458501H4A データシートの表示(PDF) - Austin Semiconductor

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5962-9458501H4A
AUSTIN
Austin Semiconductor AUSTIN
5962-9458501H4A Datasheet PDF : 13 Pages
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Austin Semiconductor, Inc.
CAPACITANCE TABLE1 (VIN = 0V, f = 1 MHz, TA = 25oC)
SYMBOL
CADD
COE
CWE, CCE
CIO
PARAMETER
A0 - A16 Capacitance
OE\ Capacitance
WE\ and CE\ Capacitance
I/O 0- I/O 31 Capacitance
MAX
40
40
10
12
NOTE: 1. This parameter is guaranteed but not tested.
EEPROM
AS8E128K32
UNITS
pF
pF
pF
pF
TRUTH TABLE
MODE
Read
Write (2)
Standby/Write
Write Inhibit
Write Inhibit
Output Disable
CE
OE
WE
VIL
VIL
VIH
VIL
VIH
VIL
VIH
X (1)
X
X
X
VIH
X
VIL
X
X
VIH
X
NOTES: 1. X can be VIL or VIH
2. Refer to AC Programming Waveforms
AC TEST CONDITIONS
I/O
DOUT
DIN
High Z
High Z
TEST SPECIFICATIONS
Input pulse levels...........................................VSS to 3V
Input rise and fall times...........................................5ns
Input timing reference levels.................................1.5V
Output reference levels.........................................1.5V
Output load................................................See Figure 1
Current Source
Device
-
Under
Test
+
Ceff = 50pf
Current Source
IOL
+
IOH
Vz = 1.5V
(Bipolar
Supply)
NOTES:
Vz is programmable from -2V to + 7V.
IOL and IOH programmable from 0 to 16 mA.
Vz is typically the midpoint of V and V .
OH
OL
IOL and IOH are adjusted to simulate a typical resistive load
circuit.
AS8E128K32
Rev. 5.5 9/01
4
Figure 1
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.

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