BCR16CM-12LA データシートの表示（PDF） - Renesas Electronics
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BCR16CM-12LA Datasheet PDF : 7 Pages
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BCR16CM-12LA
Latching Current vs.
Junction Temperature
103
7
5
3
Distribution
T2+, G–
2
Typical Example
102
7
5
3
2
101
7
5
3
2
T2+, G+
T2–, G–
Typical Example
100
–40 0
40 80 120 160
Junction Temperature (°C)
Breakover Voltage vs.
Rate of Rise of Off-State Voltage
160
Typical Example
140
Tj = 125°C
120
100
III Quadrant
80
60
I Quadrant
40
20
0
101 2 3 5 7 102 2 3 5 7 103 2 3 5 7 104
Rate of Rise of Off-State Voltage (V/µs)
Gate Trigger Current vs.
Gate Current Pulse Width
103
7
Typical Example
5
IFGT I
4
3
IRGT I IRGT III
2
102
7
5
4
3
2
101
100 2 3 4 5 7 101 2 3 4 5 7 102
Gate Current Pulse Width (µs)
Breakover Voltage vs.
Junction Temperature
160
Typical Example
140
120
100
80
60
40
20
0
–60 –40–20 0 20 40 60 80 100120140
Junction Temperature (°C)
Commutation Characteristics
7
5 Typical Example Main Voltage
Time
Tj = 125°C
(dv/dt)c
VD
3 IT = 4A
2 τ = 500µs
VD = 200V
Main Current
IT
(di/dt)c
τ Time
f = 3Hz
101
7
III Quadrant
5
Minimum
Characteristics
3
Value
2
I Quadrant
100
7
100 2 3 5 7 101 2 3 5 7 102 2 3
Rate of Decay of On-State
Commutating Current (A/ms)
Gate Trigger Characteristics Test Circuits
6Ω
6Ω
6V
A
6V
A
V
330Ω
V
330Ω
Test Procedure I
6Ω
Test Procedure II
6V
A
V
330Ω
Test Procedure III
REJ03G0298-0300 Rev.3.00 Nov 30, 2007
Page 5 of 6
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