IDT54FCT273SO データシートの表示（PDF） - Integrated Device Technology

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IDT54FCT273SO

Fast smos octal flip-flop with master reset

Integrated Device Technology 

IDT54/74FCT273/A/C FAST CMOS

OCTAL D FLIP-FLOP WITH MASTER RESET

MILITARY AND COMMERCIAL TEMPERATURE RANGES

DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE

Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V

Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%

Symbol

Parameter

Test Conditions(1)

Min. Typ.(2) Max. Unit

VIH

Input HIGH Level

Guaranteed Logic HIGH Level

2.0

—

—

V

VIL

Input LOW Level

Guaranteed Logic LOW Level

—

—

0.8

V

IIH

Input HIGH Current

IIL

Input LOW Current

VCC = Max.

VI = VCC

VI = 2.7V

VI = 0.5V

—

—

5

µA

—

—

5(4)

—

—

–5(4)

VI = GND

—

—

–5

VIK

Clamp Diode Voltage

Vcc = Min., IN = –18mA

—

–0.7 –1.2 V

IOS

Short Circuit Current

Vcc = Max.(3), VO = GND

–60

–120

—

mA

VOH

Output HIGH Voltage

Vcc = 3V, VIN = VLC or VHC, IOH = –32µA

VHC

VCC

—

V

Vcc = Min.

IOH = –300µA

VHC

VCC

—

VIN = VIH or VIL

IOH = –12mA MIL.

2.4

4.3

—

IOH = –15mA COM’L. 2.4

4.3

—

VOL

Output LOW Voltage

Vcc = 3V, VIN = VLC or VHC, IOL = 300µA

Vcc = Min.

IOL = 300µA

—

GND VLC

V

—

GND VLC(4)

VIN = VIH or VIL

IOL = 32mA MIL.

—

0.3

0.5

IOL = 48mA COM’L.

—

0.3

0.5

NOTES:

1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.

3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.

4. This parameter is guaranteed but not tested.

2558 tbl 03

7.10

3

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