DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

M64897GP データシートの表示(PDF) - Renesas Electronics

部品番号
コンポーネント説明
メーカー
M64897GP Datasheet PDF : 16 Pages
First Prev 11 12 13 14 15 16
M64897GP
Data Cording Example
Write Mode Format Example
Byte
MSB
Address byte
1
1
0
0
0
1
1
Divider byte 1
0
1
0
0
0
0
0
Divider byte 2
1
0
1
0
0
0
0
Control byte 1
1
1
0
0
0
0
1
Band SW byte
0
0
0
0
1
0
0
Note: fVCO = N 8 fREF = 16544 8 (4 MHz/1024) = 517 MHz
LSB Condition in Data Setting
0
1 ADS input VCC1
0
1 Divider ratio N = 16544
0
1
0
1 fREF divider ratio 1/1024
0
1 BS4 output ON
Read Mode Format Example (Loop locked)
Byte
Address byte
Status byte
MSB
LSB
Condition in Device
1
1
0
0
0
1
1
1
1 ADS Applied voltage
0.9 VCC1 to VCC1
0
1
1
1
1
0
1
1
1 ADS Applied voltage
0.45 VCC1 to 0.6 VCC1
Use data input for “1” so that the data of Read mode and Write mode return ACK signal “0” to micro computer in 9 bits
of each byte.
Test Mode Data Set up Method
Test Mode Bit Set up
X
: Random, 0 or 1. normal “0”
MA1, MA0 : Programmable address bit
Address Input Voltage
MA1
0 to 0.1 ± VCC1
0
Always valid
0
0.4 ± VCC1 to 0.6 ± VCC1
1
0.9 ± VCC1 to VCC1
1
Note: N14 to N0: How to set dividing ratio of the programmable the divider
Dividing ratio = N14 (214 = 16384) + + N0 (20 = 1)
Therefore, the range of divider N is 1,024 to 32,768
Example) fVCO = fREF 8 N
= 3.90625 8 N
= 31.25 N (kHz)
MA0
0
1
0
1
T2, T1, T0: Setting up for the Test Mode
T2
T1
T0
Charge Pump
0
0
X Normal operation
0
1
X High impedance
1
1
0 Sink
1
1
1 Source
1
0
0 High impedance
1
0
1 High impedance
Pin 12 Condition
ADC input
ADC input
ADC input
ADC input
fREF output
f1/N output
Mode
Normal operation
Test mode
Test mode
Test mode
Test mode
Test mode
REJ03F0167-0201 Rev.2.01 Jan 25, 2008
Page 9 of 13

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]