MC100LVE111 データシートの表示（PDF） - ON Semiconductor

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MC100LVE111

3.3V ECL 1:9 Differential Clock Driver

ON Semiconductor 

MC100LVE111

Table 2. ATTRIBUTES

Characteristics

Internal Input Pulldown Resistor

Internal Input Pullup Resistor

ESD Protection

Human Body Model

Machine Model

Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1)

Flammability Rating

Oxygen Index: 28 to 34

Transistor Count

Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test

1. For additional information, see Application Note AND8003/D.

Value

75 kW

N/A

> 2 kV

> 200 V

Level 1

UL 94 V−0 @ 0.125 in

250

Table 3. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

VCC

PECL Mode Power Supply

VEE

NECL Mode Power Supply

VI

PECL Mode Input Voltage

NECL Mode Input Voltage

Iout

Output Current

VEE = 0 V

VCC = 0 V

VEE = 0 V

VCC = 0 V

Continuous

Surge

VI  VCC

VI  VEE

8 to 0

V

−8 to 0

V

6 to 0

V

−6 to 0

V

50

mA

100

mA

IBB

VBB Sink/Source

TA

Operating Temperature Range

Tstg

Storage Temperature Range

qJA

Thermal Resistance (Junction−to−Ambient) 0 lfpm

500 lfpm

PLCC−28

PLCC−28

± 0.5

−40 to +85

−65 to +150

63.5

43.5

mA

°C

°C

°C/W

°C/W

qJC

Thermal Resistance (Junction−to−Case) Standard Board

PLCC−28

Tsol

Wave Solder

Pb <2 to 3 sec @ 248°C

Pb−Free <2 to 3 sec @ 260°C

22 to 26 ± 5%

265

265

°C/W

°C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

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