SGA-8343X データシートの表示（PDF） - Stanford Microdevices
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SGA-8343X Datasheet PDF : 9 Pages
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SGA-8343X Reliability Qualification Report
Group D
Test Conditions
Number of
Devices Under
Test
Group E
Power Temperature Cycle
Temperature = -40°C to 85°C, Asynchronous bias, Test Duration = 168
hours
20
Test
JESD22-
Results PASS
Standard
A109(A)
Low Temperature Storage
Test Conditions Temperature = -40°C, Test Duration = 1000 hours
Number of
Devices Under
Test
Group F
Test Conditions
20
Test
SMDI Internal
Results
Standard
High Temperature Storage
Temperature = 150°C, Test Duration = 1000 hours
PASS
Number of
Devices Under
Test
Group G
Test Conditions
22
Test
JESD22-
Results
Standard
A103(B)
Solderability Steam Age
Temperature = 215°C, Test Duration = 60 seconds
PASS
Number of
Devices Under
Test
Group H
Test Conditions
15
Test
JESD22-
Results
Standard
B102(C)
Condition A
Solderability Steam Age
Temperature = 245°C, Test Duration = 60 seconds
PASS
Number of
15
Devices Under
Test
Test
Standard
JESD22-
B102(C)
Condition B
Results PASS
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