VR37 データシートの表示（PDF） - Vishay Semiconductors
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VR37 Datasheet PDF : 6 Pages
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VR37
Vishay BCcomponents
High Ohmic/High Voltage Resistors
TESTS AND REQUIREMENTS
Essentially all tests are carried out in accordance with the
schedule of “IEC publication 60115-1”, category
LCT/UCT/56 (rated temperature range: Lower Category
Temperature, Upper Category Temperature; damp heat,
long term, 56 days). The testing also covers the
requirements specified by EIA and EIAJ.
The tests are carried out in accordance with IEC publication
60068-2, “Recommended basic climatic and mechanical
robustness testing procedure for electronic components”
and under standard atmospheric conditions according to
“IEC 60068-1”, subclause 5.3.
In the Test Procedures and Requirements table the tests and
requirements are listed with reference to the relevant
clauses of “IEC publications 60115-1 and 60068-2”; a short
description of the test procedure is also given. In some
instances deviations from the IEC recommendations were
necessary for our method of specifying.
All soldering tests are performed with mildly activated flux.
TEST PROCEDURES AND REQUIREMENTS
IEC
60 115-1
CLAUSE
4.16
IEC
60 068-2
TEST
METHOD
21 (U)
TEST
robustness of terminations:
PROCEDURE
REQUIREMENTS
4.16.2
21 (Ua1) tensile all samples
∅0.7 mm; load 10 N; 10 s
number of failures < 10 × 10−6
4.16.3
21 (Ub)
bending half number
of samples
4.16.4
21 (Uc)
torsion other half
of samples
4.17
20 (Ta)
solderability
∅0.7 mm; load 5 N; 4 × 90°
number of failures < 10 × 10−6
3 × 360° in opposite directions
2 s; 235 °C
no damage
∆R/R max.: ± 0.5 % + 0.05 Ω
good tinning; no damage
4.18
20 (Tb)
resistance to
soldering heat
thermal shock: 3 s; 350 °C;
3 mm from body
∆R/R max.: ± 0.5 % + 0.05 Ω
4.19
14 (Na)
rapid change of temperature
30 minutes at − 55 °C and
∆R/R max.: ± 0.5 % + 0.05 Ω
30 minutes at + 155 °C; 5 cycles
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For technical questions contact: ff3dresistors@vishay.com
Document Number: 28733
Revision: 24-Feb-04
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