WF512K32F-100G1UI5A データシートの表示（PDF） - White Electronic Designs => Micro Semi
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WF512K32F-100G1UI5A Datasheet PDF : 15 Pages
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WF512K32-XXX5
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS,CS CONTROLLED
(VCC = 5.0V, VSS = 0V, TA = -55°C to +125°C)
Parameter
Symbol
Write Cycle Time
tAVAV
tWC
Write Enable Setup Time
tWLEL
tWS
Chip Select Pulse Width
tELEH
tCP
Address Setup Time
tAVEL
tAS
Data Setup Time
tDVEH
tDS
Data Hold Time
tEHDX
tDH
Address Hold Time
tELAX
tAH
Chip Select Pulse Width High
tEHEL
tCPH
Duration of Byte Programming Operation (1) tWHWH1
Sector Erase Time (2)
tWHWH2
Read Recovery Time
tGHEL
Chip Programming Time
Chip Erase Time (3)
NOTES:
1. Typical value for tWHWH1 is 7µs.
2. Typical value for tWHWH2 is 1sec.
3. Typical value for Chip Erase Time is 8sec.
-60
Min Max
60
0
40
0
40
0
40
20
300
15
0
11
64
-70
Min Max
70
0
45
0
45
0
45
20
300
15
0
11
64
-90
Min Max
90
0
45
0
45
0
45
20
300
15
0
11
64
-120
Min Max
120
0
50
0
50
0
50
20
300
15
0
11
64
-150
Unit
Min Max
150
ns
0
ns
50
ns
0
ns
50
ns
0
ns
50
ns
20
ns
300 µs
15 sec
0
ns
11 sec
64 sec
FIG. 4
AC TEST CIRCUIT
I OL
Current Source
D.U.T.
Ceff = 50 pf
I OH
Current Source
White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520
VZ ≈ 1.5V
(Bipolar Supply)
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0 V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
NOTES:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
4
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