LTC6655CHLS8-2.5PBF データシートの表示（PDF） - Linear Technology
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LTC6655CHLS8-2.5PBF Datasheet PDF : 26 Pages
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LTC6655
Electrical Characteristics The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. VIN = VOUT + 0.5V, VOUT_S connected to VOUT_F , unless otherwise noted.
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
Output Short-Circuit Current
Shutdown Pin (SHDN)
Short VOUT to GND
Short VOUT to VIN
Logic High Input Voltage
Logic High Input Current, SHDN = 2V
20
mA
20
mA
l 2.0
l
V
12
µA
Logic Low Input Voltage
l
Logic Low Input Current, SHDN = 0.8V
l
0.8
V
15
µA
Supply Current
No Load
5
7
mA
l
7.5
mA
Shutdown Current
SHDN Tied to GND
l
20
µA
Output Voltage Noise (Note 7)
0.1Hz ≤ f ≤ 10Hz
10Hz ≤ f ≤ 1kHz
Turn-On Time
0.1% Settling, COUT = 2.7µF
Long-Term Drift of Output Voltage (Note 8) LTC6655MS8
LTC6655LS8
0.25
ppmP-P
0.67
ppmRMS
400
µs
60
ppm/√kHr
20
ppm/√kHr
Hysteresis (Note 9)
LTC6655MS8
∆T = 0°C to 70°C
∆T = –40°C to 85°C
∆T = –40°C to 125°C
20
ppm
30
ppm
60
ppm
LTC6655LS8
∆T = 0°C to 70°C
∆T = –40°C to 85°C
∆T = –40°C to 125°C
5
ppm
30
ppm
80
ppm
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: Precision may be affected if the parts are stored outside of the
specified temperature range. Large temperature changes may cause
changes in device performance due to thermal hysteresis. For best
performance, extreme temperatures should be avoided whenever possible.
Note 3: The stated temperature is typical for soldering of the leads during
manual rework. For detailed IR reflow recommendations, refer to the
Applications Information section.
Note 4: Temperature coefficient is measured by dividing the maximum
change in output voltage by the specified temperature range.
Note 5: Load regulation is measured on a pulse basis from no load to
the specified load current. Load current does not include the 2mA sense
current. Output changes due to die temperature change must be taken into
account separately.
Note 6: Excludes load regulation errors. Minimum supply for the
LTC6655‑1.25, LTC6655-2.048 and LTC6655-2.5 is set by internal
circuitry supply requirements, regardless of load condition. Minimum
supply for the LTC6655-3, LTC6655-3.3, LTC6655-4.096 and LTC6655-5
is specified by load current.
Note 7: Peak-to-peak noise is measured with a 2-pole highpass filter at
0.1Hz and 3-pole lowpass filter at 10Hz. The unit is enclosed in a still-air
environment to eliminate thermocouple effects on the leads, and the
test time is 10 seconds. Due to the statistical nature of noise, repeating
noise measurements will yield larger and smaller peak values in a given
measurement interval. By repeating the measurement for 1000 intervals,
each 10 seconds long, it is shown that there are time intervals during
which the noise is higher than in a typical single interval, as predicted by
statistical theory. In general, typical values are considered to be those for
which at least 50% of the units may be expected to perform similarly or
better. For the 1000 interval test, a typical unit will exhibit noise that is
less than the typical value listed in the Electrical Characteristics table in
more than 50% of its measurement intervals. See Application Note 124 for
noise testing details. RMS noise is measured with a spectrum analyzer in a
shielded environment.
Note 8: Long-term stability typically has a logarithmic characteristic and
therefore, changes after 1000 hours tend to be much smaller than before
that time. Total drift in the second thousand hours is normally less than
one-third that of the first thousand hours with a continuing trend toward
reduced drift with time. Long-term stability is also affected by differential
stresses between the IC and the board material created during board
assembly.
Note 9: Hysteresis in output voltage is created by mechanical stress
that differs depending on whether the IC was previously at a higher or
lower temperature. Output voltage is always measured at 25°C, but
the IC is cycled to the hot or cold temperature limit before successive
measurements. Hysteresis is roughly proportional to the square of the
temperature change. For instruments that are stored at well controlled
temperatures (within 20 or 30 degrees of operational temperature),
hysteresis is usually not a significant error source. Typical hysteresis is the
worst case of 25°C to cold to 25°C or 25°C to hot to 25°C, preconditioned
by one thermal cycle.
6655ff
For more information www.linear.com/LTC6655
5
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