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ILX555K データシートの表示(PDF) - Sony Semiconductor

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ILX555K Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
ILX555K
Electrooptical Characteristics (Note 1)
(Ta = 25°C, VDD = 12V, fφRS = 1MHz, Input clock = 5Vp-p,
Light source = 3200K, IR cut filter CM-500S (t = 1.0mm))
Item
Symbol
Min.
Sensitivity
Sensitivity nonuniformity
Saturation output voltage
Saturation exposure
Dark voltage average
Dark signal nonuniformity
Red
Green
Blue
Red
Green
Blue
RR
RG
RB
PRNU
VSAT
SER
SEG
SEB
VDRK
DSNU
0.98
0.98
0.85
1.5
0.74
0.74
0.86
Image lag
IL
Supply current
Total transfer efficiency
Output impedance
Offset level
IVDD
TTE
92
ZO
VOS
Typ. Max.
Unit
Remarks
1.5
2.02
1.5
2.02 V/(lx · s) Note 2
1.3
1.75
4
20
%
Note 3
1.8
V
Note 4
1.20
1.20
lx · s
Note 5
1.38
2
5
mV
Note 6
4
12
mV
0.02
%
Note 7
30
50
mA
98
%
360
4.7
V
Note 8
Notes)
1. In accordance with the given electrooptical characteristics, the black level is defined as the average value of
D18, D19 to D67.
2. For the sensitivity test light is applied with a uniform intensity of illumination.
3. PRNU is defined as indicated below. Ray incidence conditions are the same as for Note 2.
VOUT = 500mV (Typ.)
PRNU = (VMAX VMIN)/2 × 100 [%]
VAVE
4. Use below the minimum value of the saturation output voltage.
5. Saturation exposure is defined as follows.
SE = VSAT
R
Where R indicates RR, RG, RB, and SE indicates SER, SEG, SEB.
6. Optical signal accumulated time τ int stands at 5.5ms.
7. VOUT-G = 500mV (Typ.)
8. Vos is defined as indicated bellow.
VOUT
VOUT indicates VOUT-R, VOUT-G and VOUT-B.
VOS
GND
3

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